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Volumn 7, Issue 4, 2012, Pages 1881-1889

AFM studies on surface morphology, topography and texture of nanostructured zinc aluminum oxide thin films

Author keywords

AFM; DC reactive magnetron sputtering; Surface roughness; Thin film

Indexed keywords


EID: 84870434068     PISSN: None     EISSN: 18423582     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (187)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.