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Volumn 266, Issue 7, 2008, Pages 1049-1054

AFM and photoluminescence studies of swift heavy ion induced nanostructured aluminum oxide thin films

Author keywords

Atomic force microscope; Nanostructures; Photoluminescence; Swift heavy ions; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON BEAMS; HEAVY IONS; PHOTOLUMINESCENCE; THIN FILMS;

EID: 43049156400     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.12.115     Document Type: Article
Times cited : (22)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.