메뉴 건너뛰기




Volumn 26, Issue 10, 2012, Pages 3177-3191

Three-dimensional fuzzy influence analysis of fitting algorithms on integrated chip topographic modeling

Author keywords

Integrated chip surface; Micro topography; Performance influence; Surface fitting algorithm; Three dimensional fuzzy analysis

Indexed keywords

CHIP SURFACES; DATA SEQUENCES; FITTING ALGORITHMS; FUZZY ANALYSIS; FUZZY EVALUATING; INFLUENCE ANALYSIS; INFLUENCE MECHANISM; MATHEMATICAL RELATION; MICRO TOPOGRAPHY; MICRO-MODELING; MODELING PROCESS; PARAMETER CONDITIONS; PERFORMANCE INFLUENCE; PHYSICAL CONTROL; POINT CLOUD; QUANTITATIVE EVALUATING; SPATIAL COORDINATES; SPATIAL FEATURES; SPATIAL MODELING; SURFACE MODELS; SURFACE PRECISION; TOPOGRAPHIC FEATURES;

EID: 84870288920     PISSN: 1738494X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12206-012-0832-6     Document Type: Article
Times cited : (11)

References (24)
  • 1
    • 0024698846 scopus 로고
    • Measurement of the geometric features of a cutting tool edge with the aid of a digital processing technique
    • Y. Maeda, H. Uchida and A. Yamamoto, Measurement of the geometric features of a cutting tool edge with the aid of a digital processing technique, Precision Engineering, 11(6) (1989) 165-171.
    • (1989) Precision Engineering , vol.11 , Issue.6 , pp. 165-171
    • Maeda, Y.1    Uchida, H.2    Yamamoto, A.3
  • 2
    • 15944391322 scopus 로고    scopus 로고
    • A new approach for enhancement applied to low-contrast-lowillumination IC and documents
    • C. -C. Leung, K.-S. Chan, H.-M. Chan and W.-K. Tsui, A new approach for enhancement applied to low-contrast-lowillumination IC and documents, Pattern Recognition Letters, 6(4) (2005) 769-778.
    • (2005) Pattern Recognition Letters , vol.6 , Issue.4 , pp. 769-778
    • Leung, C.-C.1    Chan, K.-S.2    Chan, H.-M.3    Tsui, W.-K.4
  • 3
    • 77649181799 scopus 로고    scopus 로고
    • Defect detection of IC wafer based on two-dimension wavelet transform
    • H. Liu, W. Zhou, Q. Kuang, L. Cao and B. Gao, Defect detection of IC wafer based on two-dimension wavelet transform, Microelectronics Journal, 41(5) (2010) 171-177.
    • (2010) Microelectronics Journal , vol.41 , Issue.5 , pp. 171-177
    • Liu, H.1    Zhou, W.2    Kuang, Q.3    Cao, L.4    Gao, B.5
  • 5
    • 0037988795 scopus 로고    scopus 로고
    • Surface topographical characterization of silver-plated film on the wedge bond ability of leaded IC packages
    • T. Y. Lin, K. L. Davison and W. S. Leong, Surface topographical characterization of silver-plated film on the wedge bond ability of leaded IC packages, Microelectronics Reliability, 3(9) (2003) 803-809.
    • (2003) Microelectronics Reliability , vol.3 , Issue.9 , pp. 803-809
    • Lin, T.Y.1    Davison, K.L.2    Leong, W.S.3
  • 6
    • 0033143222 scopus 로고    scopus 로고
    • A new bi-functional topography and current probe for scanning force microscope testing of integrated circuits
    • S. Bae, K. Schiemann, W. Mertin, E. Kubalek and M. Maywald, A new bi-functional topography and current probe for scanning force microscope testing of integrated circuits, Microelectronics Reliability, 39(4) (1999) 975-980.
    • (1999) Microelectronics Reliability , vol.39 , Issue.4 , pp. 975-980
    • Bae, S.1    Schiemann, K.2    Mertin, W.3    Kubalek, E.4    Maywald, M.5
  • 7
    • 0033166181 scopus 로고    scopus 로고
    • Wavelet transform for 3-D reconstruction from series sectional medicals
    • J.-D. Lee, Wavelet transform for 3-D reconstruction from series sectional medicals, Mathematical and Computer Modeling, 30(10) (1999) 1-13.
    • (1999) Mathematical and Computer Modeling , vol.30 , Issue.10 , pp. 1-13
    • Lee, J.-D.1
  • 8
    • 0032064591 scopus 로고    scopus 로고
    • Approximate numerical models of 3-D surface topography generated using sparse frequency domain descriptions
    • I. Sherrington and G. W. Howarth, Approximate numerical models of 3-D surface topography generated using sparse frequency domain descriptions, International Journal of Machine Tools and Manufacture, 38(4) (1998) 599-606.
    • (1998) International Journal of Machine Tools and Manufacture , vol.38 , Issue.4 , pp. 599-606
    • Sherrington, I.1    Howarth, G.W.2
  • 9
    • 0028383010 scopus 로고
    • Interactive surface modeling, an implementation of an expert system for specification of surface roughness and topography
    • B. -G. Rosén, R. Ohlsson and J. Westberg, Interactive surface modeling, an implementation of an expert system for specification of surface roughness and topography, International Journal of Machine Tools and Manufacture, 35(11) (1995) 317-324.
    • (1995) International Journal of Machine Tools and Manufacture , vol.35 , Issue.11 , pp. 317-324
    • Rosén, B.-G.1    Ohlsson, R.2    Westberg, J.3
  • 10
    • 79952445718 scopus 로고    scopus 로고
    • 3D laser investigation on micron-scale grain protrusion topography of truncated diamond grinding wheel for precision grinding performance
    • J. Xie, F. Wei, J. H. Zheng, J. Tamaki and A. Kubo, 3D laser investigation on micron-scale grain protrusion topography of truncated diamond grinding wheel for precision grinding performance, International Journal of Machine Tools and Manufacture, 51(12) (2011) 411-419.
    • (2011) International Journal of Machine Tools and Manufacture , vol.51 , Issue.12 , pp. 411-419
    • Xie, J.1    Wei, F.2    Zheng, J.H.3    Tamaki, J.4    Kubo, A.5
  • 11
    • 0032689328 scopus 로고    scopus 로고
    • Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine
    • L. De Chiffre, H. N. Hansen and N. Kofod, Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine, CIRP Annals - Manufacturing Technology, 48(9) (1999) 463-466.
    • (1999) CIRP Annals - Manufacturing Technology , vol.48 , Issue.9 , pp. 463-466
    • De Chiffre, L.1    Hansen, H.N.2    Kofod, N.3
  • 12
    • 0032064591 scopus 로고    scopus 로고
    • Approximate numerical models of 3-d surface topography generated using sparse frequency domain descriptions
    • I. Sherrington and G. W. Howarth, Approximate numerical models of 3-d surface topography generated using sparse frequency domain descriptions, International Journal of Machine Tools and Manufacture, 38(5) (1998) 599-606.
    • (1998) International Journal of Machine Tools and Manufacture , vol.38 , Issue.5 , pp. 599-606
    • Sherrington, I.1    Howarth, G.W.2
  • 13
    • 64049099259 scopus 로고    scopus 로고
    • Bio-speckle, Laser spectral analysis under the inertia moment, entropy and crossspectrum methods
    • C. M. B. Nobre, R. A. Braga Jr, A. G. Costa, R. R. Cardoso, W. S. da Silva and T. Sáfadi, Bio-speckle, Laser spectral analysis under the inertia moment, entropy and crossspectrum methods, Optics Communications, 282(2) (2009) 2236-2242.
    • (2009) Optics Communications , vol.282 , Issue.2 , pp. 2236-2242
    • Nobre, C.M.B.1    Braga Jr., R.A.2    Costa, A.G.3    Cardoso, R.R.4    da Silva, W.S.5    Sáfadi, T.6
  • 14
    • 2342646159 scopus 로고    scopus 로고
    • Measuring the signal-to-noise ratio in magnetic resonance imaging: a caveat
    • D. Erdogmus, E. G. Larsson, R. Yan and J. C. Principe, Jeffrey R. Fitzsimmons, Measuring the signal-to-noise ratio in magnetic resonance imaging: a caveat, Signal Processing, 4(3) (2004) 1035-1040.
    • (2004) Signal Processing , vol.4 , Issue.3 , pp. 1035-1040
    • Erdogmus, D.1    Larsson, E.G.2    Yan, R.3    Principe, J.C.4    Fitzsimmons, J.R.5
  • 15
    • 77949490701 scopus 로고    scopus 로고
    • An adaptive signal-tonoise ratio estimator in mobile communication channels
    • J. Hua, L. Meng, Z. Xu and G. Li, An adaptive signal-tonoise ratio estimator in mobile communication channels, Digital Signal Processing, 20(7) (2010) 692-698.
    • (2010) Digital Signal Processing , vol.20 , Issue.7 , pp. 692-698
    • Hua, J.1    Meng, L.2    Xu, Z.3    Li, G.4
  • 16
    • 0033900230 scopus 로고    scopus 로고
    • Complex potentials and singular integral equation for curve crack problem in anti-plane elasticity
    • Y. Z. Chen, Complex potentials and singular integral equation for curve crack problem in anti-plane elasticity, International Journal of Engineering Science, 38(8) (2000) 565-574.
    • (2000) International Journal of Engineering Science , vol.38 , Issue.8 , pp. 565-574
    • Chen, Y.Z.1
  • 17
    • 0033890867 scopus 로고    scopus 로고
    • Parallel adaptive subspace correction schemes with applications to elasticity
    • M. Griebel and G. Zumbusch, Parallel adaptive subspace correction schemes with applications to elasticity, Computer Methods in Applied Mechanics and Engineering, 184(3) (2000) 303-332.
    • (2000) Computer Methods in Applied Mechanics and Engineering , vol.184 , Issue.3 , pp. 303-332
    • Griebel, M.1    Zumbusch, G.2
  • 18
    • 79551495178 scopus 로고    scopus 로고
    • Design charts for elastic pile shortening in the equivalent top-download-settlement curve from a bidirectional load test
    • J. L. C. Mission and H.-J. Kim, Design charts for elastic pile shortening in the equivalent top-download-settlement curve from a bidirectional load test, Computers and Geotechnics, 8(7) (2011) 167-177.
    • (2011) Computers and Geotechnics , vol.8 , Issue.7 , pp. 167-177
    • Mission, J.L.C.1    Kim, H.-J.2
  • 19
    • 16244374965 scopus 로고    scopus 로고
    • Modelling the load curve of aggregate electricity consumption using principal components
    • M. Manera and A. Marzullo, Modelling the load curve of aggregate electricity consumption using principal components, Environmental Modeling & Software, 20(8) (2005) 1389-1400.
    • (2005) Environmental Modeling & Software , vol.20 , Issue.8 , pp. 1389-1400
    • Manera, M.1    Marzullo, A.2
  • 20
    • 77952793296 scopus 로고    scopus 로고
    • Interaction curves for vibration and buckling of thin-walled composite box beams under axial loads and end moments
    • T. P. Vo and J. Lee, Interaction curves for vibration and buckling of thin-walled composite box beams under axial loads and end moments, Applied Mathematical Modeling, 34(7) (2010) 3142-3157.
    • (2010) Applied Mathematical Modeling , vol.34 , Issue.7 , pp. 3142-3157
    • Vo, T.P.1    Lee, J.2
  • 22
    • 45149143267 scopus 로고
    • Geometric modeling of IC die bonds for inspection
    • K. N. Ngan and S. B. Kang, Geometric modeling of IC die bonds for inspection, Pattern Recognition Letters, 10(3) (1989) 47-52.
    • (1989) Pattern Recognition Letters , vol.10 , Issue.3 , pp. 47-52
    • Ngan, K.N.1    Kang, S.B.2
  • 23
    • 77955515776 scopus 로고    scopus 로고
    • High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model
    • C. -S. Lin, J. T. Huang, T.-C. Wei, M.-S. Yeh and D.-C. Chen, High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model, Optics & Laser Technology, 43(3) (2011) 218-225.
    • (2011) Optics & Laser Technology , vol.43 , Issue.3 , pp. 218-225
    • Lin, C.-S.1    Huang, J.T.2    Wei, T.-C.3    Yeh, M.-S.4    Chen, D.-C.5
  • 24
    • 0025252734 scopus 로고
    • Locating IC defects in process monitors and test structures using optical beam induced current
    • K. C. Stevens and T. J. Wilson, Locating IC defects in process monitors and test structures using optical beam induced current, Microelectronic Engineering, 12(5) (1990) 397-404.
    • (1990) Microelectronic Engineering , vol.12 , Issue.5 , pp. 397-404
    • Stevens, K.C.1    Wilson, T.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.