-
1
-
-
0024698846
-
Measurement of the geometric features of a cutting tool edge with the aid of a digital processing technique
-
Y. Maeda, H. Uchida and A. Yamamoto, Measurement of the geometric features of a cutting tool edge with the aid of a digital processing technique, Precision Engineering, 11(6) (1989) 165-171.
-
(1989)
Precision Engineering
, vol.11
, Issue.6
, pp. 165-171
-
-
Maeda, Y.1
Uchida, H.2
Yamamoto, A.3
-
2
-
-
15944391322
-
A new approach for enhancement applied to low-contrast-lowillumination IC and documents
-
C. -C. Leung, K.-S. Chan, H.-M. Chan and W.-K. Tsui, A new approach for enhancement applied to low-contrast-lowillumination IC and documents, Pattern Recognition Letters, 6(4) (2005) 769-778.
-
(2005)
Pattern Recognition Letters
, vol.6
, Issue.4
, pp. 769-778
-
-
Leung, C.-C.1
Chan, K.-S.2
Chan, H.-M.3
Tsui, W.-K.4
-
3
-
-
77649181799
-
Defect detection of IC wafer based on two-dimension wavelet transform
-
H. Liu, W. Zhou, Q. Kuang, L. Cao and B. Gao, Defect detection of IC wafer based on two-dimension wavelet transform, Microelectronics Journal, 41(5) (2010) 171-177.
-
(2010)
Microelectronics Journal
, vol.41
, Issue.5
, pp. 171-177
-
-
Liu, H.1
Zhou, W.2
Kuang, Q.3
Cao, L.4
Gao, B.5
-
4
-
-
0029222644
-
Micro-fabrication of complex surface topographies using fuzzy-tone lithography
-
B. Wagner, H. J. Quenzer, W. Henke, W. Hoppe and W. Pilz, Micro-fabrication of complex surface topographies using fuzzy-tone lithography, Sensors and Actuators A: Physical, 6(4) (1995) 89-94.
-
(1995)
Sensors and Actuators A: Physical
, vol.6
, Issue.4
, pp. 89-94
-
-
Wagner, B.1
Quenzer, H.J.2
Henke, W.3
Hoppe, W.4
Pilz, W.5
-
5
-
-
0037988795
-
Surface topographical characterization of silver-plated film on the wedge bond ability of leaded IC packages
-
T. Y. Lin, K. L. Davison and W. S. Leong, Surface topographical characterization of silver-plated film on the wedge bond ability of leaded IC packages, Microelectronics Reliability, 3(9) (2003) 803-809.
-
(2003)
Microelectronics Reliability
, vol.3
, Issue.9
, pp. 803-809
-
-
Lin, T.Y.1
Davison, K.L.2
Leong, W.S.3
-
6
-
-
0033143222
-
A new bi-functional topography and current probe for scanning force microscope testing of integrated circuits
-
S. Bae, K. Schiemann, W. Mertin, E. Kubalek and M. Maywald, A new bi-functional topography and current probe for scanning force microscope testing of integrated circuits, Microelectronics Reliability, 39(4) (1999) 975-980.
-
(1999)
Microelectronics Reliability
, vol.39
, Issue.4
, pp. 975-980
-
-
Bae, S.1
Schiemann, K.2
Mertin, W.3
Kubalek, E.4
Maywald, M.5
-
7
-
-
0033166181
-
Wavelet transform for 3-D reconstruction from series sectional medicals
-
J.-D. Lee, Wavelet transform for 3-D reconstruction from series sectional medicals, Mathematical and Computer Modeling, 30(10) (1999) 1-13.
-
(1999)
Mathematical and Computer Modeling
, vol.30
, Issue.10
, pp. 1-13
-
-
Lee, J.-D.1
-
8
-
-
0032064591
-
Approximate numerical models of 3-D surface topography generated using sparse frequency domain descriptions
-
I. Sherrington and G. W. Howarth, Approximate numerical models of 3-D surface topography generated using sparse frequency domain descriptions, International Journal of Machine Tools and Manufacture, 38(4) (1998) 599-606.
-
(1998)
International Journal of Machine Tools and Manufacture
, vol.38
, Issue.4
, pp. 599-606
-
-
Sherrington, I.1
Howarth, G.W.2
-
9
-
-
0028383010
-
Interactive surface modeling, an implementation of an expert system for specification of surface roughness and topography
-
B. -G. Rosén, R. Ohlsson and J. Westberg, Interactive surface modeling, an implementation of an expert system for specification of surface roughness and topography, International Journal of Machine Tools and Manufacture, 35(11) (1995) 317-324.
-
(1995)
International Journal of Machine Tools and Manufacture
, vol.35
, Issue.11
, pp. 317-324
-
-
Rosén, B.-G.1
Ohlsson, R.2
Westberg, J.3
-
10
-
-
79952445718
-
3D laser investigation on micron-scale grain protrusion topography of truncated diamond grinding wheel for precision grinding performance
-
J. Xie, F. Wei, J. H. Zheng, J. Tamaki and A. Kubo, 3D laser investigation on micron-scale grain protrusion topography of truncated diamond grinding wheel for precision grinding performance, International Journal of Machine Tools and Manufacture, 51(12) (2011) 411-419.
-
(2011)
International Journal of Machine Tools and Manufacture
, vol.51
, Issue.12
, pp. 411-419
-
-
Xie, J.1
Wei, F.2
Zheng, J.H.3
Tamaki, J.4
Kubo, A.5
-
11
-
-
0032689328
-
Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine
-
L. De Chiffre, H. N. Hansen and N. Kofod, Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine, CIRP Annals - Manufacturing Technology, 48(9) (1999) 463-466.
-
(1999)
CIRP Annals - Manufacturing Technology
, vol.48
, Issue.9
, pp. 463-466
-
-
De Chiffre, L.1
Hansen, H.N.2
Kofod, N.3
-
12
-
-
0032064591
-
Approximate numerical models of 3-d surface topography generated using sparse frequency domain descriptions
-
I. Sherrington and G. W. Howarth, Approximate numerical models of 3-d surface topography generated using sparse frequency domain descriptions, International Journal of Machine Tools and Manufacture, 38(5) (1998) 599-606.
-
(1998)
International Journal of Machine Tools and Manufacture
, vol.38
, Issue.5
, pp. 599-606
-
-
Sherrington, I.1
Howarth, G.W.2
-
13
-
-
64049099259
-
Bio-speckle, Laser spectral analysis under the inertia moment, entropy and crossspectrum methods
-
C. M. B. Nobre, R. A. Braga Jr, A. G. Costa, R. R. Cardoso, W. S. da Silva and T. Sáfadi, Bio-speckle, Laser spectral analysis under the inertia moment, entropy and crossspectrum methods, Optics Communications, 282(2) (2009) 2236-2242.
-
(2009)
Optics Communications
, vol.282
, Issue.2
, pp. 2236-2242
-
-
Nobre, C.M.B.1
Braga Jr., R.A.2
Costa, A.G.3
Cardoso, R.R.4
da Silva, W.S.5
Sáfadi, T.6
-
14
-
-
2342646159
-
Measuring the signal-to-noise ratio in magnetic resonance imaging: a caveat
-
D. Erdogmus, E. G. Larsson, R. Yan and J. C. Principe, Jeffrey R. Fitzsimmons, Measuring the signal-to-noise ratio in magnetic resonance imaging: a caveat, Signal Processing, 4(3) (2004) 1035-1040.
-
(2004)
Signal Processing
, vol.4
, Issue.3
, pp. 1035-1040
-
-
Erdogmus, D.1
Larsson, E.G.2
Yan, R.3
Principe, J.C.4
Fitzsimmons, J.R.5
-
15
-
-
77949490701
-
An adaptive signal-tonoise ratio estimator in mobile communication channels
-
J. Hua, L. Meng, Z. Xu and G. Li, An adaptive signal-tonoise ratio estimator in mobile communication channels, Digital Signal Processing, 20(7) (2010) 692-698.
-
(2010)
Digital Signal Processing
, vol.20
, Issue.7
, pp. 692-698
-
-
Hua, J.1
Meng, L.2
Xu, Z.3
Li, G.4
-
16
-
-
0033900230
-
Complex potentials and singular integral equation for curve crack problem in anti-plane elasticity
-
Y. Z. Chen, Complex potentials and singular integral equation for curve crack problem in anti-plane elasticity, International Journal of Engineering Science, 38(8) (2000) 565-574.
-
(2000)
International Journal of Engineering Science
, vol.38
, Issue.8
, pp. 565-574
-
-
Chen, Y.Z.1
-
17
-
-
0033890867
-
Parallel adaptive subspace correction schemes with applications to elasticity
-
M. Griebel and G. Zumbusch, Parallel adaptive subspace correction schemes with applications to elasticity, Computer Methods in Applied Mechanics and Engineering, 184(3) (2000) 303-332.
-
(2000)
Computer Methods in Applied Mechanics and Engineering
, vol.184
, Issue.3
, pp. 303-332
-
-
Griebel, M.1
Zumbusch, G.2
-
18
-
-
79551495178
-
Design charts for elastic pile shortening in the equivalent top-download-settlement curve from a bidirectional load test
-
J. L. C. Mission and H.-J. Kim, Design charts for elastic pile shortening in the equivalent top-download-settlement curve from a bidirectional load test, Computers and Geotechnics, 8(7) (2011) 167-177.
-
(2011)
Computers and Geotechnics
, vol.8
, Issue.7
, pp. 167-177
-
-
Mission, J.L.C.1
Kim, H.-J.2
-
19
-
-
16244374965
-
Modelling the load curve of aggregate electricity consumption using principal components
-
M. Manera and A. Marzullo, Modelling the load curve of aggregate electricity consumption using principal components, Environmental Modeling & Software, 20(8) (2005) 1389-1400.
-
(2005)
Environmental Modeling & Software
, vol.20
, Issue.8
, pp. 1389-1400
-
-
Manera, M.1
Marzullo, A.2
-
20
-
-
77952793296
-
Interaction curves for vibration and buckling of thin-walled composite box beams under axial loads and end moments
-
T. P. Vo and J. Lee, Interaction curves for vibration and buckling of thin-walled composite box beams under axial loads and end moments, Applied Mathematical Modeling, 34(7) (2010) 3142-3157.
-
(2010)
Applied Mathematical Modeling
, vol.34
, Issue.7
, pp. 3142-3157
-
-
Vo, T.P.1
Lee, J.2
-
21
-
-
67349144111
-
Pattern classification by using improved wavelet Compressed Zernike Moments
-
G. A. Papakostas, Y. S. Boutalis, D. A. Karras and B. G. Mertzios, Pattern classification by using improved wavelet Compressed Zernike Moments, Applied Mathematics and Computation, 36(10) (2009) 162-176.
-
(2009)
Applied Mathematics and Computation
, vol.36
, Issue.10
, pp. 162-176
-
-
Papakostas, G.A.1
Boutalis, Y.S.2
Karras, D.A.3
Mertzios, B.G.4
-
22
-
-
45149143267
-
Geometric modeling of IC die bonds for inspection
-
K. N. Ngan and S. B. Kang, Geometric modeling of IC die bonds for inspection, Pattern Recognition Letters, 10(3) (1989) 47-52.
-
(1989)
Pattern Recognition Letters
, vol.10
, Issue.3
, pp. 47-52
-
-
Ngan, K.N.1
Kang, S.B.2
-
23
-
-
77955515776
-
High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model
-
C. -S. Lin, J. T. Huang, T.-C. Wei, M.-S. Yeh and D.-C. Chen, High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model, Optics & Laser Technology, 43(3) (2011) 218-225.
-
(2011)
Optics & Laser Technology
, vol.43
, Issue.3
, pp. 218-225
-
-
Lin, C.-S.1
Huang, J.T.2
Wei, T.-C.3
Yeh, M.-S.4
Chen, D.-C.5
-
24
-
-
0025252734
-
Locating IC defects in process monitors and test structures using optical beam induced current
-
K. C. Stevens and T. J. Wilson, Locating IC defects in process monitors and test structures using optical beam induced current, Microelectronic Engineering, 12(5) (1990) 397-404.
-
(1990)
Microelectronic Engineering
, vol.12
, Issue.5
, pp. 397-404
-
-
Stevens, K.C.1
Wilson, T.J.2
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