Pattern classification by using improved wavelet Compressed Zernike Moments

Applied Mathematics and Computation

Volumn 212, Issue 1, 2009, Pages 162-176

  Papakostas, G A ^a   Boutalis, Y S ^a   Karras, D A ^b   Mertzios, B G ^a  

^a DEMOCRITUS UNIVERSITY OF THRACE   (Greece)

^b Chalkis Institute of Technology   (Greece)

Author keywords

Compressed features; Feature extraction; Pattern classification; Zernike moments

Indexed keywords

CLASSIFICATION RATES; COMPRESSED FEATURES; DISCRIMINATIVE FEATURES; FEATURE EXTRACTION METHODS; FEATURE VECTORS; INFORMATION CONTENTS; INFORMATION LOSS; PATTERN CLASSIFICATION; VALIDATION TESTS; WAVELET COEFFICIENTS; ZERNIKE MOMENTS;

FACE RECOGNITION; IMAGE RETRIEVAL; METAL RECOVERY; VECTORS;

FEATURE EXTRACTION;

EID: 67349144111     PISSN: 00963003     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.amc.2009.02.029     Document Type: Article

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