High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model

Optics and Laser Technology

Volumn 43, Issue 1, 2011, Pages 218-225

  Lin, Chern Sheng ^a   Tsung Huang, Jui ^a   Wei, Tzu Chi ^a   Yeh, Mau Shiun ^b   Chen, Der Chin ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Calibration model; Laser marking; Line scan CCD

Indexed keywords

AUTOMATIC OPTICAL INSPECTION; CALIBRATION ALGORITHM; CALIBRATION MODEL; GAIN AND OFFSET; HIGH RESOLUTION; HIGH-SPEED; HIGH-SPEED CCD; LASER MARKING; LASER MARKING SYSTEM; LINE SCAN CCD; MOTOR DRIVE; NOVEL ALGORITHM; POSITION FEEDBACK; POSITIONING ACCURACY; PROCESS CAPABILITY INDICES; SUB PIXELS; TOTAL PROCESSING TIME;

ALGORITHMS; ELECTRIC DRIVES; IMAGE PROCESSING; MARKING MACHINES; OPTICAL DATA PROCESSING; OPTICAL TESTING; SPEED;

CALIBRATION;

EID: 77955515776     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2010.06.017     Document Type: Article

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