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Volumn 101, Issue 21, 2012, Pages

Cutting forces related with lattice orientations of graphene using an atomic force microscopy based nanorobot

(8) Zhang, Yu a,b Gao, Yang b,c Liu, Lianqing a Xi, Ning a,d,e Wang, Yuechao a Ma, Laipeng c Dong, Zaili a Wejinya, Uchechukwu C a,f

a SHENYANG INSTITUTE OF AUTOMATION (China)

b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES (China)

c INSTITUTE OF METAL RESEARCH (China)

d Michigan State University (United States)

e CITY UNIVERSITY OF HONG KONG (Hong Kong)

f University of Arkansas (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ANALYSIS METHOD; ATOMIC RESOLUTION IMAGES; CLOSE LOOP; CUTTING EXPERIMENT; CUTTING FORCES; CUTTING-DIRECTION; FABRICATION STRATEGIES; FEED-BACK SENSORS; GRAPHENE LATTICES; HONEYCOMB LATTICES; LATTICE ORIENTATIONS; NANO ROBOTS; SAMPLE ROTATION;

ATOMIC FORCE MICROSCOPY; GRAPHENE; MONOLAYERS; NANOROBOTICS; ROBOTS;

CUTTING;

EID: 84870038658 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4767230 Document Type: Article

Times cited : (30)

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