Accurate modeling and simulation of bridging faults

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1991, Pages

  Acken, John A ^a   Millman, Steven D ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING - COMPUTER APPLICATIONS; LOGIC CIRCUITS - AUTOMATIC TESTING;

ASIC DESIGN; AUTOMATIC TEST PATTERN GENERATION; BRIDGING FAULTS; CMOS TESTING; COMPUTER AIDED TESTING; FAULT MODELING;

INTEGRATED CIRCUITS, CMOS;

EID: 0026407676     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)