ON FAULT DETECTION IN CMOS LOGIC NETWORKS.

Proceedings - Design Automation Conference

Volumn , Issue , 1983, Pages 50-56

  Chiang, Kuang Wei ^a   Vranesic, Zvonko G ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTS OF OPEN AND SHORT FAULTS; FAULTS DETECTABLE BY TESTING; HEURISTIC METHOD FOR DETECTION OF SINGLE FAULTS; ORGANIZING TEST SEQUENCES;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0020593469     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)