Detecting bridging faults with stuck-at test sets

Digest of Papers - International Test Conference

Volumn , Issue , 1988, Pages 773-783

  Millman, Steven D ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; SEMICONDUCTOR DEVICES, MOS;

BRIDGING FAULTS; CMOS TECHNOLOGY; FAULT-FREE CIRCUITS; FEEDBACK FAULTS; STUCK-AT TEST SETS;

INTEGRATED CIRCUITS, VLSI;

EID: 0024122852     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)