Identification of defective regions in thin-film Si solar cells for new-generation energy devices

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 3118-3123

  Naruse, Yohko ^a   Matsumoto, Mitsuhiro ^a   Sekimoto, Takeyuki ^a   Hishida, Mitsuoki ^a   Aya, Youichirou ^a   Shinohara, Wataru ^a   Fukushima, Atsushi ^a   Yata, Shigeo ^a   Terakawa, Akira ^a   Iseki, Masahiro ^a   Tanaka, Makoto ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

microstructure; photovoltaic cells; silicon

Indexed keywords

ENERGY DEVICES; FORMATION MODEL; GLASS SUBSTRATES; LASER PATTERNING; MODULE EFFICIENCY; OPTICAL CONFINEMENT; SI SOLAR CELLS; SOLAR CELL PERFORMANCE; SOLAR MODULE; TANDEM SOLAR CELLS; TEXTURE STRUCTURE; TRANSPARENT CONDUCTIVE OXIDES;

CHEMICAL VAPOR DEPOSITION; CONVERSION EFFICIENCY; DEPOSITION; EFFICIENCY; MICROSTRUCTURE; PHOTOVOLTAIC CELLS; PLASMA CONFINEMENT; SILICON SOLAR CELLS; SUBSTRATES; THIN FILMS;

SILICON;

EID: 84869424965     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6318240     Document Type: Conference Paper

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