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Volumn 68, Issue 2, 2013, Pages 146-149

Identification of a bilayer grain boundary complexion in Bi-doped Cu

Author keywords

Aberration corrected STEM; Adsorption; Complexion; Embrittlement; Grain boundary segregation

Indexed keywords

ABERRATION-CORRECTED; ABERRATION-CORRECTED STEM; BI-DOPED; BI-LAYER; COMPLEXION; DIRECT IMAGING; GRAIN BOUNDARY SEGREGATION; NANOSCALE FACETING; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 84869136250     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2012.10.012     Document Type: Article
Times cited : (83)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.