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Volumn 68, Issue 2, 2013, Pages 146-149
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Identification of a bilayer grain boundary complexion in Bi-doped Cu
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Author keywords
Aberration corrected STEM; Adsorption; Complexion; Embrittlement; Grain boundary segregation
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Indexed keywords
ABERRATION-CORRECTED;
ABERRATION-CORRECTED STEM;
BI-DOPED;
BI-LAYER;
COMPLEXION;
DIRECT IMAGING;
GRAIN BOUNDARY SEGREGATION;
NANOSCALE FACETING;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
ADSORPTION;
EMBRITTLEMENT;
GRAIN BOUNDARIES;
TRANSMISSION ELECTRON MICROSCOPY;
BISMUTH;
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EID: 84869136250
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2012.10.012 Document Type: Article |
Times cited : (83)
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References (21)
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