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Volumn 66, Issue 5, 2012, Pages 203-206

A grain boundary phase transition in Si-Au

Author keywords

Aberration corrected STEM; Complexion; Grain boundary; Interfaces; Phase transition

Indexed keywords

ABERRATION-CORRECTED STEM; ABRUPT TRANSITION; BI-LAYER; BROAD APPLICATION; COMPLEXION; FIRST-ORDER; GRAIN BOUNDARY PHASE; INTERFACIAL PHASE;

EID: 84655162202     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2011.10.011     Document Type: Article
Times cited : (44)

References (42)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.