Variability in the segregation of bismuth between grain boundaries in copper

Acta Materialia

Volumn 55, Issue 15, 2007, Pages 5149-5155

  Keast, V J ^a   La Fontaine, A ^b   du Plessis, J ^c  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

^c RMIT UNIVERSITY   (Australia)

Author keywords

Auger electron spectroscopy (AES); Copper alloys; Electron diffraction; Grain boundary segregation; X ray energy dispersive spectroscopy (XEDS)

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BISMUTH; COPPER ALLOYS; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; X RAY CRYSTALLOGRAPHY;

CRYSTALLOGRAPHIC ANALYSIS; GRAIN BOUNDARY SEGREGATION; X-RAY ENERGY DISPERSIVE SPECTROSCOPY (XEDS);

SURFACE SEGREGATION;

EID: 34547701895     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.05.034     Document Type: Article

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