Preferential orientation of fluorine-doped SnO 2 thin films: The effects of growth temperature

Acta Materialia

Volumn 61, Issue 1, 2013, Pages 22-31

  Consonni, V ^a   Rey, G ^a   Roussel, H ^a   Doisneau, B ^a,b   Blanquet, E ^b   Bellet, D ^a  

^a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

^b CNRS   (France)

Author keywords

Grain growth; Polycrystalline thin films; Texture; Transparent conductive oxides

Indexed keywords

ABNORMAL GRAIN GROWTH; BIAXIAL MODULUS; CRYSTALLOGRAPHIC ORIENTATIONS; ELASTIC STRAIN; ENERGY MINIMIZATION; FLUORINE-DOPED; LOW GROWTH TEMPERATURE; PER UNIT VOLUME; PHYSICAL QUANTITIES; POLYCRYSTALLINE; POLYCRYSTALLINE THIN FILM; PREFERENTIAL ORIENTATION; PREFERRED ORIENTATIONS; STRAIN ENERGY DENSITY; TEXTURE EFFECTS; TEXTURE MAPS; TEXTURE TRANSITION; THERMODYNAMIC SIMULATIONS; TOTAL FREE ENERGY; TRANSPARENT CONDUCTIVE OXIDES; ULTRASONIC SPRAY PYROLYSIS; X-RAY DIFFRACTION MEASUREMENTS;

CHEMICAL POTENTIAL; FLUORINE; GRAIN GROWTH; INTERFACIAL ENERGY; OXYGEN; SPRAY PYROLYSIS; TEXTURES; THIN FILMS; X RAY DIFFRACTION;

GROWTH TEMPERATURE;

EID: 84869093123     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2012.09.006     Document Type: Article

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