Visualizing strain evolution and coordinated buckling within CNT arrays by in situ digital image correlation

Advanced Functional Materials

Volumn 22, Issue 22, 2012, Pages 4686-4695

  Maschmann, Matthew R ^a,b   Ehlert, Gregory J ^c   Park, Sei Jin ^d   Mollenhauer, David ^a   Maruyama, Benji ^a   Hart, A John ^d   Baur, Jeffery W ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b UNIVERSAL TECHNOLOGY CORPORATION   (United States)

^c UNIVERSITY OF FLORIDA   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

Author keywords

carbon nanotubes; compression; digital image correlation; mechanics; yield strain

Indexed keywords

BUCKLING BEHAVIORS; CARBON NANOTUBE ARRAY; DEFORMATION MODES; DIGITAL IMAGE CORRELATIONS; ELECTRICAL CONTACTS; FORCE SENSOR; FULL-FIELD; HIGH CONTRAST; NANO SCALE; PRINCIPAL STRAIN; SITU SCANNING ELECTRON MICROSCOPY; SPATIAL MAPPING; SPECKLE PATTERNS; STRAIN EVOLUTION; STRAIN FIELDS; STRAIN MAPS; THERMAL INTERFACES; YIELD STRAIN;

ASPECT RATIO; BENDING (DEFORMATION); CARBON NANOTUBES; COMPACTION; IMAGE ANALYSIS; MECHANICS; SPECKLE; STRAIN MEASUREMENT;

BUCKLING;

EID: 84869019837     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201200676     Document Type: Article

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