Full-field thermal deformation measurements in a scanning electron microscope by 2D digital image correlation

Experimental Mechanics

Volumn 48, Issue 5, 2008, Pages 635-646

  Li, N ^a   Sutton, M A ^a   Li, X ^a   Schreier, H W ^b  

^a University of South Carolina   (United States)

^b Correlated Solutions ^*  (United States)

Author keywords

2D digital image correlation; Imaging; Random pattern application; Scanning electron microscope; Thermal strain measurement

Indexed keywords

2D DIGITAL IMAGE CORRELATION; IMAGING; RANDOM PATTERN APPLICATION; SCANNING ELECTRON MICROSCOPE; THERMAL STRAIN MEASUREMENT;

ALUMINA; COMPUTER NETWORKS; DEFORMATION; SCANNING ELECTRON MICROSCOPY;

HEATING;

EID: 51249090778     PISSN: 00144851     EISSN: 17412765     Source Type: Journal    
DOI: 10.1007/s11340-007-9107-z     Document Type: Article

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