Combined ATR infrared microspectroscopy and SIL raman microspectroscopy

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1316-1317

  Sohn, A F ^a   Tisinger, L G ^a   Sommer, A J ^a  

^a MIAMI UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544306877     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604884757     Document Type: Conference Paper

References (3)

1. C.D. Poweleit et al., Applied Physics Letters, 73 (1998) 2275.
2. T. D. Milster, Proceedings of the IEEE, 88 (2000) 1480.
3. J. A. Reffner et al., Proceddings of SPIE Int. Soc. Opt. Eng. 1575 (1991) 301.