Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram

Rapid Communications in Mass Spectrometry

Volumn 26, Issue 23, 2012, Pages 2815-2821

  Aoyagi, Satoka ^a   Gilmore, Ian S ^b   Mihara, Ichiro ^c   Seah, Martin P ^b   Fletcher, Ian W ^d  

^a SHIMANE UNIVERSITY   (Japan)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^c KURARAY CO LTD   (Japan)

^d Intertek MSG   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMINO ACIDS; CONTAMINATION; ENZYMES; IMPURITIES; INDIUM COMPOUNDS; IONS; SECONDARY EMISSION; SILICON WAFERS; SUBSTRATES; TIN OXIDES;

AMINO-ACIDS; FRAGMENTATION MECHANISM; INDIUM TIN OXIDE SUBSTRATES; MASS SPECTRA; MODELLING SYSTEMS; PRIMARY IONS; PRIORI INFORMATION; SECONDARY ION-MASS SPECTROMETRY; SPECTRA'S; SPECTRAL COMPONENTS;

SECONDARY ION MASS SPECTROMETRY;

EID: 84868352020     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.6409     Document Type: Article

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