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Volumn 112, Issue 8, 2012, Pages

Low contact resistivity of metals on nitrogen-doped cuprous oxide (Cu 2O) thin-films

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER HEIGHTS; CIRCULAR TRANSMISSION LINE MODEL; CONTACT RESISTIVITIES; CUPROUS OXIDE; CURRENT-VOLTAGE MEASUREMENTS; HEAVILY DOPED; NITROGEN-DOPED; NITROGEN-DOPING; PD CONTACTS; SOLAR CELL MATERIALS; SPECIFIC CONTACT RESISTIVITY; TEMPERATURE DEPENDENT; UNDOPED FILMS; X RAY PHOTOEMISSION SPECTROSCOPY;

EID: 84868347882     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4758305     Document Type: Article
Times cited : (23)

References (21)
  • 1
    • 15944362680 scopus 로고
    • 10.1103/PhysRev.117.998
    • F. L. Weichman, Phys. Rev. 117, 998 (1960). 10.1103/PhysRev.117.998
    • (1960) Phys. Rev. , vol.117 , pp. 998
    • Weichman, F.L.1
  • 11
    • 49149141662 scopus 로고
    • 10.1016/0038-1101(80)90086-6
    • G. K. Reeves, Solid State Electron. 23, 487 (1980). 10.1016/0038-1101(80) 90086-6
    • (1980) Solid State Electron. , vol.23 , pp. 487
    • Reeves, G.K.1
  • 20
    • 0014735482 scopus 로고
    • 10.1016/0038-1101(70)90056-0
    • A. Y. C. Yu, Solid State Electron. 13, 239 (1970). 10.1016/0038-1101(70) 90056-0
    • (1970) Solid State Electron. , vol.13 , pp. 239
    • Yu, A.Y.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.