On columnar thin films as platforms for surface-plasmonic-polaritonic optical sensing: Higher-order considerations

Optics Communications

Volumn 285, Issue 24, 2012, Pages 5535-5542

  Jamaian, Siti S ^a   MacKay, Tom G ^a,b  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b The Pennsylvania State University   (United States)

Author keywords

Bruggeman formalism; Columnar thin film; Strong permittivity fluctuation theory; Surface plasmon polariton

Indexed keywords

ANGLE OF INCIDENCE; BRUGGEMAN FORMALISM; COLUMNAR THIN FILMS; CORRELATION LENGTHS; EXTENDED VERSIONS; FLUCTUATION THEORY; HOMOGENIZATION TECHNIQUES; KRETSCHMANN CONFIGURATION; NUMERICAL STUDIES; OPTICAL SENSING; PERFORMANCE PARAMETERS; PHASE SPEED; PLANAR INTERFACE; SECOND ORDERS; STATISTICAL DISTRIBUTION; SURFACE PLASMON POLARITONS; THEORETICAL APPROACH; THIN LAYERS;

ELECTROMAGNETIC WAVE POLARIZATION; HOMOGENIZATION METHOD; PERMITTIVITY; PLASMONS; REFRACTIVE INDEX; SURFACE PLASMON RESONANCE;

THIN FILMS;

EID: 84867572947     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2012.08.006     Document Type: Article

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