Modeling columnar thin films as platforms for surface-plasmonic-polaritonic optical sensing

Photonics and Nanostructures - Fundamentals and Applications

Volumn 8, Issue 3, 2010, Pages 140-149

  Mackay, Tom G ^a,b   Lakhtakia, Akhlesh ^b  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b The Pennsylvania State University   (United States)

Author keywords

Bruggeman homogenization formalism; Columnar thin film; Surface plasmon polariton

Indexed keywords

BOUNDARY VALUE PROBLEMS; ELECTROMAGNETIC WAVE POLARIZATION; PARTICLE OPTICS; PERMITTIVITY; PHONONS; PHOTONS; PLASMONS; QUANTUM THEORY; REFRACTIVE INDEX; SURFACE PLASMON RESONANCE; WAVE PROPAGATION;

BRUGGEMAN HOMOGENIZATION FORMALISM; COLUMNAR THIN FILMS; KRETSCHMANN CONFIGURATION; NANO-SCALE MODELING; PROPAGATION LENGTHS; RELATIVE PERMITTIVITY; SURFACE PLASMON POLARITONS; TWO BOUNDARY VALUE PROBLEMS;

THIN FILMS;

EID: 77958196787     PISSN: 15694410     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.photonics.2010.02.003     Document Type: Article

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