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Volumn 209, Issue 4-6, 2002, Pages 369-375

On calibration of a nominal structure-property relationship model for chiral sculptured thin films by axial transmittance measurements

(3) Sherwin, J A a Lakhtakia, A a Hodgkinson, I J b

a The Pennsylvania State University (United States)

b UNIVERSITY OF OTAGO (New Zealand)

Author keywords

Bruggeman formalism; Chiral sculptured thin film; Circular Bragg phenomenon; Model calibration; Structure properties relationship model; Transmittance measurements

Indexed keywords

CALIBRATION; MATHEMATICAL MODELS; THIN FILMS; TITANIUM OXIDES;

SCULPTURED THIN FILMS (STF);

OPTICAL COMMUNICATION;

EID: 0037103170 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(02)01672-3 Document Type: Article

Times cited : (52)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.