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Materials Chemistry and Physics

Volumn 136, Issue 2-3, 2012, Pages 680-687

Raman scattering, microstructural and dielectric studies on Ba 1-xCa xBi 4Ti 4O 15 ceramics

(5) Kumar, Sunil a Kundu, Swarup a Ochoa, D A b Garcia, J E b Varma, K B R a

a INDIAN INSTITUTE OF SCIENCE (India)

b UNIVERSITAT POLITÈCNICA DE CATALUNYA (Spain)

Author keywords

Ceramics; Electronic characterisation; Ferroelectricity; Raman spectroscopy and scattering

Indexed keywords

AVERAGE GRAIN SIZE; CERAMICS; COERCIVE FIELD; DIELECTRIC STUDIES; DIFFUSENESS OF THE PHASE TRANSITION; ELECTRONIC CHARACTERISATION; ENDMEMBERS; FREQUENCY INDEPENDENT; HIGH TEMPERATURE; LAYERED STRUCTURES; MICRO-STRUCTURAL; MICROWAVE DIELECTRICS; ORTHORHOMBIC DISTORTION; PIEZOELECTRIC COEFFICIENT; POLYCRYSTALLINE POWDERS; RAMAN SPECTROSCOPY AND SCATTERING; RED SHIFT; REMNANT POLARIZATIONS; ROOM TEMPERATURE; SCATTERING TECHNIQUES; STRUCTURAL CHANGE; TEMPERATURE COEFFICIENT OF DIELECTRIC CONSTANT; TUNABILITIES; XRD ANALYSIS;

BISMUTH; CERAMIC MATERIALS; DIELECTRIC LOSSES; DIELECTRIC MATERIALS; FERROELECTRICITY; RAMAN SCATTERING; SOLID STATE REACTIONS; X RAY DIFFRACTION;

CALCIUM;

EID: 84867402720 PISSN: 02540584 EISSN: None Source Type: Journal
DOI: 10.1016/j.matchemphys.2012.07.042 Document Type: Article

Times cited : (58)

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