Structure and ferroelectric property of Nb-doped SrBi4Ti 4O15 ceramics

Journal of Electroceramics

Volumn 22, Issue 4, 2009, Pages 357-362

  Hao, Hua ^a   Liu, Hanxing ^a   Ouyang, Shixi ^a  

^a WUHAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Bismuth layer structure ferroelectrics (BLSF); Dope; Ferroelectric properties

Indexed keywords

BISMUTH LAYER STRUCTURE FERROELECTRICS (BLSF); CONVENTIONAL METHODS; DOPE; FERROELECTRIC PROPERTIES; FERROELECTRIC PROPERTY; NB DOPING; PIEZOELECTRIC COEFFICIENT; RAMAN SPECTRUM; REMANENT POLARIZATION; SECONDARY PHASE; SINGLE PHASE; XPS; XRD; XRD PATTERNS;

BISMUTH; DOPING (ADDITIVES); FERROELECTRIC MATERIALS; FERROELECTRICITY; HYSTERESIS; NIOBIUM; PIEZOELECTRICITY; SOLIDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

STRUCTURAL PROPERTIES;

EID: 67649133367     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-007-9180-9     Document Type: Article

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