메뉴 건너뛰기




Volumn , Issue , 2011, Pages

Metal semiconductor (MES) TSVs in 3D ICs: Electrical modeling and design

Author keywords

3D IC; cross talk; metal insular semiconductor transmission line; through silicon via

Indexed keywords

3-D ICS; DIELECTRIC LINERS; ELECTRICAL DESIGN; ELECTRICAL MODELING; HIGH FREQUENCY SIGNALS; METAL INSULATOR SEMICONDUCTOR STRUCTURES; METAL SEMICONDUCTORS; QUASI-TEM; SILICON SUBSTRATES; SLOW WAVE; THROUGH-SILICON-VIA;

EID: 84866878450     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/3DIC.2012.6263049     Document Type: Conference Paper
Times cited : (7)

References (11)
  • 2
    • 47349100893 scopus 로고    scopus 로고
    • Package technology to address the memory bandwidth challenge for tera-scale computing
    • aug.
    • G. Hu, H. Kalyanam, S. Krishnamoorthy, and L. Polka, "Package technology to address the memory bandwidth challenge for tera-scale computing," Intel Technology Journal, vol. 11, no. 3, aug. 2007.
    • (2007) Intel Technology Journal , vol.11 , Issue.3
    • Hu, G.1    Kalyanam, H.2    Krishnamoorthy, S.3    Polka, L.4
  • 3
    • 78650018928 scopus 로고    scopus 로고
    • Compact ac modeling and performance analysis of through-silicon vias in 3-d ics
    • dec.
    • C. Xu, H. Li, R. Suaya, and K. Banerjee, "Compact ac modeling and performance analysis of through-silicon vias in 3-d ics," Electron Devices, IEEE Transactions on, vol. 57, no. 12, pp. 3405-3417, dec. 2010.
    • (2010) Electron Devices, IEEE Transactions on , vol.57 , Issue.12 , pp. 3405-3417
    • Xu, C.1    Li, H.2    Suaya, R.3    Banerjee, K.4
  • 4
    • 84941603444 scopus 로고
    • Prediction of crosstalk in ribbon cables: Comparison of model predictions and experimental results
    • aug.
    • C. Paul, "Prediction of crosstalk in ribbon cables: Comparison of model predictions and experimental results," Electromagnetic Compatibility, IEEE Transactions on, vol. EMC-20, no. 3, pp. 394-406, aug. 1978.
    • (1978) Electromagnetic Compatibility, IEEE Transactions on , vol.EMC-20 , Issue.3 , pp. 394-406
    • Paul, C.1
  • 10
    • 79960780734 scopus 로고    scopus 로고
    • Stress characterization of tungsten-filled through silicon via arrays using very high resolution multi-wavelength raman spectroscopy
    • [Online]. Available
    • J. Gambino, D. Vanslette, B. Webb, C. Luce, T. Ueda, T. Ishigaki, K. Kang, and W. S. Yoo, "Stress characterization of tungsten-filled through silicon via arrays using very high resolution multi-wavelength raman spectroscopy," ECS Transactions, vol. 35, no. 2, pp. 105-115, 2011. [Online]. Available: http://link.aip.org/link/abstract/ECSTF8/v35/i2/p105/s1
    • (2011) ECS Transactions , vol.35 , Issue.2 , pp. 105-115
    • Gambino, J.1    Vanslette, D.2    Webb, B.3    Luce, C.4    Ueda, T.5    Ishigaki, T.6    Kang, K.7    Yoo, W.S.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.