Wideband measurement of extreme impedances with a multistate reflectometer

2008 72nd ARFTG Microwave Measurement Symposium, ARFTG 2008

Volumn , Issue , 2008, Pages 45-49

  Lewandowski, Arkadiusz ^a   LeGolvan, Denis ^b   Ginley, Ronald A ^b   Wallis, T Mitchell ^b   Imtiaz, Atif ^b   Kabos, Pavel ^b  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Broadband measurements; Calibration; High impedance loads

Indexed keywords

BROADBAND MEASUREMENTS; ELECTRONICALLY TUNABLE; HIGH IMPEDANCE LOADS; MEASUREMENT BANDWIDTH; MEASUREMENT RESULTS; MEASUREMENT UNCERTAINTY; MULTI STATE; POWER SPLITTERS; REFERENCE IMPEDANCE; STATISTICAL TECHNIQUES; VARIABLE PARAMETERS; WIDEBAND MEASUREMENTS;

CALIBRATION; DC GENERATORS; MEASUREMENTS; OPTICAL INSTRUMENTS; REFLECTOMETERS;

UNCERTAINTY ANALYSIS;

EID: 67649198825     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2008.4804300     Document Type: Conference Paper

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