A simple method for extreme impedances measurement - Experimental testing

2008 72nd ARFTG Microwave Measurement Symposium, ARFTG 2008

Volumn , Issue , 2008, Pages 40-44

  Randus, Martin ^a   Hoffmann, Karel ^a  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

Calibration; Impedance measurement; Microwave circuits; Microwave measurements; Nanotechnology

Indexed keywords

AGILENT; CALIBRATION STANDARD; CALIBRATION TECHNIQUES; CLASSICAL METHODS; ERROR MODEL; EXPERIMENTAL TESTING; IMPEDANCE MEASUREMENT; IN-PHASE; MEASUREMENT SYSTEM; MICROWAVE TEST; NOVEL METHODS; REAL MEASUREMENTS; REFLECTION COEFFICIENTS; SIMPLE METHOD; VECTOR NETWORK ANALYZERS;

CALIBRATION; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; MICROWAVE CIRCUITS; MICROWAVE DEVICES; MICROWAVE MEASUREMENT; MICROWAVES; NANOTECHNOLOGY; REFLECTION; RESISTORS; SYSTEM STABILITY;

MEASUREMENTS;

EID: 67649213389     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2008.4804276     Document Type: Conference Paper

References (7)

1. M. Randus, and K. Hoffmann, "A simple method for extreme impedances measurement," 2007 ARFTG Int. Conference. December 2007.
2. P. J. Burke, Z. Yu, S. Li, and C. Rutherglen, "Nanotube technology for microwave applications," 2005 IEEE MTT Int. Microwave Symp. 2005.
3. Z. Yu, C. Rutherglen, and P. J. Burke, "Microwave nanotube transistor operation at high bias," Applied Physics Letters, 88, 233115. 2006.
4. Z. Yu, and P. J. Burke, "Microwave transport in metallic singlewalled carbon nanotubes," Nano Letters, 5, pp. 1403-1406, 2005. (Pubitemid 41084425)
5. Agilent Technologies, Impedance Measurement Handbook, Agilent Technologies Co. Ltd., July 2006, P/N 5950-13000
6. H. Tanbakuchi, M. Richter, and M. Whitener, "Design of scanning capacitance microscope," 2006 ARFTG Int. Conference. November 2006.
7. Agilent Technologies, Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers (Application Note 1287-11, Agilent Technologies Co. Ltd., April 2006, P/N 5989-4840EN.