Broadband scanning microwave microscopy investigation of graphene

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2011, Pages

  Fabiani, Silvia ^a   Mencarelli, Davide ^a   Di Donato, Andrea ^a   Monti, Tamara ^a   Venanzoni, Giuseppe ^a   Morini, Antonio ^a   Rozzi, Tullio ^a   Farina, Marco ^a  

^a UNIVERSITÀ POLITECNICA DELLE MARCHE   (Italy)

Author keywords

Microwave Imaging; Microwave Measurement; Nanotechnology; Scanning Probe Microscopy

Indexed keywords

BROADBAND SCANNING; DUAL CHANNEL; HIGH QUALITY; MICROWAVE IMAGES; MICROWAVE IMAGING; MICROWAVE MICROSCOPY; NANOMETRIC RESOLUTION; NEAR-FIELD SCANNING; SCANNING PROBE MICROSCOPE; SCANNING PROBES; SCANNING TUNNELING MICROSCOPY (STM); TIME DOMAIN; WIDE-BAND;

GOLD COATINGS; GOLD DEPOSITS; GRAPHENE; IMAGING SYSTEMS; PROBES; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON COMPOUNDS;

MICROWAVES;

EID: 80052318503     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2011.5972890     Document Type: Conference Paper

References (8)

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