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Volumn , Issue , 2012, Pages 2705-2708

Variation-resilient current-mode logic circuit design using MTJ devices

Author keywords

[No Author keywords available]

Indexed keywords

90NM CMOS; COMPENSATING ELEMENT; CURRENT MODE; CURRENT MODE LOGIC; HSPICE SIMULATIONS; PERFORMANCE CAPABILITY; RESISTANCE VALUES; VLSI PROCESSORS;

EID: 84866603530     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2012.6271866     Document Type: Conference Paper
Times cited : (5)

References (12)
  • 1
    • 75149159985 scopus 로고    scopus 로고
    • Verification of threshold voltage variation of scaled transistors with ultralarge-scale device matrix array test element group
    • T. Tsunomura, A. Nishida and T. Hiramoto,"Verification of threshold voltage variation of scaled transistors with ultralarge-scale device matrix array test element group," Jpn. J. Appl. Phys., vol. 48, no. 12, p. 124505, 2009.
    • (2009) Jpn. J. Appl. Phys. , vol.48 , Issue.12 , pp. 124505
    • Tsunomura, T.1    Nishida, A.2    Hiramoto, T.3
  • 2
    • 84866604871 scopus 로고    scopus 로고
    • http://www. itrs. net
  • 8
    • 33846353150 scopus 로고    scopus 로고
    • Power-aware design techniques for nanometer MOS current-mode logic gates: A design framework
    • M. Alioto and G. Palumbo,"Power-Aware Design Techniques for Nanometer MOS Current-Mode Logic Gates: a Design Framework," IEEE Circuits Syst. Mag., vol. 6, no. 4, pp. 40-59, 2006.
    • (2006) IEEE Circuits Syst. Mag. , vol.6 , Issue.4 , pp. 40-59
    • Alioto, M.1    Palumbo, G.2
  • 9
    • 0035368886 scopus 로고    scopus 로고
    • 0.18-?m CMOS 10-Gbs/s multiplexer/demulitiplexer ICs using current mode logic with tolerance to threshold voltage fluctuation
    • A. Tanabe, M. Umetani, I. Fujiwara, T. Ogura, K. Kataoka, M. Okihara and H. Sakuraba,"0. 18-?m CMOS 10-Gbs/s Multiplexer/Demulitiplexer ICs Using Current Mode logic with Tolerance to Threshold Voltage Fluctuation," IEEE J. Solid-state Circuits, Vol 36, no. 6, pp. 988-996, 2001.
    • (2001) IEEE J. Solid-state Circuits , vol.36 , Issue.6 , pp. 988-996
    • Tanabe, A.1    Umetani, M.2    Fujiwara, I.3    Ogura, T.4    Kataoka, K.5    Okihara, M.6    Sakuraba, H.7
  • 12
    • 84864259382 scopus 로고    scopus 로고
    • Process-variation-aware VLSI design using an emerging functional devices and its impact
    • M. Natsui and T. Hanyu,"Process-Variation-Aware VLSI Design Using an Emerging Functional Devices and Its Impact," 19th International Workshop on Post-Binary ULSI Systems, pp. 20-25, 2010.
    • (2010) 19th International Workshop on Post-Binary ULSI Systems , pp. 20-25
    • Natsui, M.1    Hanyu, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.