-
1
-
-
75149159985
-
Verification of threshold voltage variation of scaled transistors with ultralarge-scale device matrix array test element group
-
T. Tsunomura, A. Nishida and T. Hiramoto,"Verification of threshold voltage variation of scaled transistors with ultralarge-scale device matrix array test element group," Jpn. J. Appl. Phys., vol. 48, no. 12, p. 124505, 2009.
-
(2009)
Jpn. J. Appl. Phys.
, vol.48
, Issue.12
, pp. 124505
-
-
Tsunomura, T.1
Nishida, A.2
Hiramoto, T.3
-
2
-
-
84866604871
-
-
http://www. itrs. net
-
-
-
-
3
-
-
48649087666
-
Understanding random threshold voltage fluctuation by comparing multiple fabs and technologies
-
Dec
-
K. Takeuchi, T. Fukai, T. Tsunomura, A. T. Putra, A. Nishida, S. Kamohara and T. Hiramoto,"Understanding random threshold voltage fluctuation by comparing multiple fabs and technologies," IEDM Tech. Dig., Dec. 2007, pp. 467-470.
-
(2007)
IEDM Tech. Dig.
, pp. 467-470
-
-
Takeuchi, K.1
Fukai, T.2
Tsunomura, T.3
Putra, A.T.4
Nishida, A.5
Kamohara, S.6
Hiramoto, T.7
-
4
-
-
34247863686
-
Magnetic tunnel junctions for spintronic memories and beyond
-
S. Ikeda, J. Hayakawa, Y. M. Lee, F. Matsukura, Y. Ohno, T. Hanyu, and H. Ohno,"Magnetic Tunnel Junctions for Spintronic Memories and Beyond," IEEE Trans. Electron Devices, vol. 54, no. 05, pp. 991-1002, 2007.
-
(2007)
IEEE Trans. Electron Devices
, vol.54
, Issue.5
, pp. 991-1002
-
-
Ikeda, S.1
Hayakawa, J.2
Lee, Y.M.3
Matsukura, F.4
Ohno, Y.5
Hanyu, T.6
Ohno, H.7
-
5
-
-
60349132341
-
Standby-power-free compact ternary content-addressable memory cell chip using magnetic tunnel junction devices
-
S. Matsunaga, K. Hiyama, A. Matsumoto, S. Ikeda, H. Hasegawa, K. Miura, J. Hayakawa, T. Endoh H. Ohno, and T. Hanyu,"Standby-Power-Free Compact Ternary Content-Addressable Memory Cell Chip Using Magnetic Tunnel Junction Devices," Applied Physics Express (APEX), vol. 2, no. 2, pp. 023004-1-023004-3, 2009.
-
(2009)
Applied Physics Express (APEX)
, vol.2
, Issue.2
, pp. 0230041-0230043
-
-
Matsunaga, S.1
Hiyama, K.2
Matsumoto, A.3
Ikeda, S.4
Hasegawa, H.5
Miura, K.6
Hayakawa, J.7
Endoh Ohno, H.T.8
Hanyu, T.9
-
6
-
-
70449359801
-
Fabrication of a nonvolatile lookup-table circuit chip using magneto/semiconductor-hybrid structure for an immediate-power-up field programmable gate array
-
D. Suzuki, M. Natsui, S. Ikeda, H. Hasegawa, K. Miura, J. Hayakawa, T. Endoh, H. Ohno, and T. Hanyu,"Fabrication of a Nonvolatile Lookup-Table Circuit Chip Using Magneto/Semiconductor-Hybrid Structure for an Immediate-Power-Up Field Programmable Gate Array," IEEE 2009 Symposia on VLSI Circuits, Dig. Tech. Papers, pp. 80-81, 2009.
-
(2009)
IEEE 2009 Symposia on VLSI Circuits, Dig. Tech. Papers
, pp. 80-81
-
-
Suzuki, D.1
Natsui, M.2
Ikeda, S.3
Hasegawa, H.4
Miura, K.5
Hayakawa, J.6
Endoh, T.7
Ohno, H.8
Hanyu, T.9
-
7
-
-
0030174025
-
A GHz MOS adaptive pipeline technique using MOS current-mode logic
-
M. Mizuno, M. Yamashina, K. Furuta, H. Igura, H. Abiko, K. Okabe, A. Ono, and H. Yamada,"A GHz MOS adaptive pipeline technique using MOS current-mode logic," IEEE J. Solid-State Circuits, vol. 31, no. 6, pp. 784-791, 1996.
-
(1996)
IEEE J. Solid-State Circuits
, vol.31
, Issue.6
, pp. 784-791
-
-
Mizuno, M.1
Yamashina, M.2
Furuta, K.3
Igura, H.4
Abiko, H.5
Okabe, K.6
Ono, A.7
Yamada, H.8
-
8
-
-
33846353150
-
Power-aware design techniques for nanometer MOS current-mode logic gates: A design framework
-
M. Alioto and G. Palumbo,"Power-Aware Design Techniques for Nanometer MOS Current-Mode Logic Gates: a Design Framework," IEEE Circuits Syst. Mag., vol. 6, no. 4, pp. 40-59, 2006.
-
(2006)
IEEE Circuits Syst. Mag.
, vol.6
, Issue.4
, pp. 40-59
-
-
Alioto, M.1
Palumbo, G.2
-
9
-
-
0035368886
-
0.18-?m CMOS 10-Gbs/s multiplexer/demulitiplexer ICs using current mode logic with tolerance to threshold voltage fluctuation
-
A. Tanabe, M. Umetani, I. Fujiwara, T. Ogura, K. Kataoka, M. Okihara and H. Sakuraba,"0. 18-?m CMOS 10-Gbs/s Multiplexer/Demulitiplexer ICs Using Current Mode logic with Tolerance to Threshold Voltage Fluctuation," IEEE J. Solid-state Circuits, Vol 36, no. 6, pp. 988-996, 2001.
-
(2001)
IEEE J. Solid-state Circuits
, vol.36
, Issue.6
, pp. 988-996
-
-
Tanabe, A.1
Umetani, M.2
Fujiwara, I.3
Ogura, T.4
Kataoka, K.5
Okihara, M.6
Sakuraba, H.7
-
10
-
-
77956031280
-
A perpendicular-anisotropy CoFeB-MgO magnetic tunnel junction
-
S. Ikeda, K. Miura, H. Yamamoto, K. Mizunuma, H. D. Gan, M. Endo, S. Kanai, J. Hayakawa, F. Matsukura, and H. Ohno,"A perpendicular-anisotropy CoFeB-MgO magnetic tunnel junction," Nature Mater. Vol. 9, pp. 721-724, 2010.
-
(2010)
Nature Mater.
, vol.9
, pp. 721-724
-
-
Ikeda, S.1
Miura, K.2
Yamamoto, H.3
Mizunuma, K.4
Gan, H.D.5
Endo, M.6
Kanai, S.7
Hayakawa, J.8
Matsukura, F.9
Ohno, H.10
-
11
-
-
85008008190
-
2 Mb SPRAM (SPin-transfer torque RAM) with bit-by-bit bi-directional current write and parallelizing-direction current read
-
T. Kawahara, R. Takemura, K. Miura, J. Hayakawa, S. Ikeda, Y. M. Lee, R. Sasaki, Y. Goto, K. Ito, T. Meguro, F. Matsukura, H. Takahashi, H. Matsuoka, and H. Ohno,"2 Mb SPRAM (SPin-Transfer Torque RAM) With Bit-by-Bit Bi-Directional Current Write and Parallelizing-Direction Current Read," IEEE J. Solid-State Circuits vol. 43, no. 1 pp. 109-120, 2008.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, Issue.1
, pp. 109-120
-
-
Kawahara, T.1
Takemura, R.2
Miura, K.3
Hayakawa, J.4
Ikeda, S.5
Lee, Y.M.6
Sasaki, R.7
Goto, Y.8
Ito, K.9
Meguro, T.10
Matsukura, F.11
Takahashi, H.12
Matsuoka, H.13
Ohno, H.14
-
12
-
-
84864259382
-
Process-variation-aware VLSI design using an emerging functional devices and its impact
-
M. Natsui and T. Hanyu,"Process-Variation-Aware VLSI Design Using an Emerging Functional Devices and Its Impact," 19th International Workshop on Post-Binary ULSI Systems, pp. 20-25, 2010.
-
(2010)
19th International Workshop on Post-Binary ULSI Systems
, pp. 20-25
-
-
Natsui, M.1
Hanyu, T.2
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