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Volumn 82, Issue , 2012, Pages 367-371

Seedless copper electroplating on Ta from an alkaline activated bath

Author keywords

Electroplating; Oxide removal; Seedless copper; Single bath; Ta barrier

Indexed keywords

APPLIED POTENTIALS; BARRIER FILMS; COPPER ELECTRODEPOSITION; COPPER ELECTROPLATING; COPPER INTERCONNECTS; COPPER LAYER; CU ELECTROPLATING; ELECTROCHEMICAL BATH; ELECTROLYTIC BATHS; FEATURE DIMENSIONS; METALLIZATION TECHNIQUES; NEGATIVE POTENTIAL; NUCLEATION AND GROWTH; OXIDE REMOVAL; SEED LAYER; SEED LAYER THICKNESS; SHORT PERIODS; SINGLE BATH; TWO-COMPONENT;

EID: 84866432135     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2012.03.033     Document Type: Conference Paper
Times cited : (7)

References (14)
  • 8
    • 0003745040 scopus 로고
    • 2nd ed. National Association of Corrosion Engineers Houston, USA (Chapter IV, Section 09.3 - Tantalum)
    • M. Pourbaix Atlas of Electrochemical Equilibria in Aqueous Solutions 2nd ed. 1976 National Association of Corrosion Engineers Houston, USA (Chapter IV, Section 09.3 - Tantalum)
    • (1976) Atlas of Electrochemical Equilibria in Aqueous Solutions
    • Pourbaix, M.1
  • 9
    • 0004209522 scopus 로고
    • 2nd ed. Newnes-Butterworths London
    • 2nd ed. L.L. Shreir Corrosion vol. 1 1995 Newnes-Butterworths London
    • (1995) Corrosion , vol.1
    • Shreir, L.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.