Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy

Physical Review Letters

Volumn 87, Issue 23, 2001, Pages 236104-1-236104-4

  Hofer, W A ^a   Fisher, A J ^a   Wolkow, R A ^b   Grutter P ^c  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84866236662     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.87.236104     Document Type: Article

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