Chemical and microscopic analysis of graphene prepared by different reduction degrees of graphene oxide

Journal of Alloys and Compounds

Volumn 536, Issue SUPPL.1, 2012, Pages

  Solis Fernandez P ^a   Rozada, R ^a   Paredes, J I ^a   Villar Rodil, S ^a   Fernandez Merino M J ^a   Guardia, L ^a   Martinez Alonso A ^a   Tascon J M D ^a  

^a INSTITUTO NACIONAL DEL CARBÓN   (Spain)

Author keywords

Atomic force microscopy; Graphene oxide; Reduction; Scanning tunneling microscopy; Temperature programmed desorption

Indexed keywords

AFM; ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPY; BASAL POSITION; CHEMICAL REDUCTION; EXFOLIATED GRAPHITE; GRAPHENE OXIDES; GRAPHENE PLANE; GRAPHENE SHEETS; MASS PRODUCTION; MICROSCOPIC ANALYSIS; MICROSCOPIC STRUCTURES; OXYGEN GROUPS; REDUCTION DEGREE; RESIDUAL OXYGEN; STRUCTURAL DISORDERS;

ATOMIC FORCE MICROSCOPY; GRAPHENE; PHOTOELECTRONS; REDUCTION; SCANNING TUNNELING MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

TEMPERATURE PROGRAMMED DESORPTION;

EID: 84865690678     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2012.01.102     Document Type: Conference Paper

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