Scanning electrochemical microscopy for the fabrication of copper nanowires: Atomic contacts with quantized conductance, and molecular adsorption effect

Electrochimica Acta

Volumn 83, Issue , 2012, Pages 7-12

  Janin, Marion ^a   Ghilane, Jalal ^a   Lacroix, Jean Christophe ^a  

^a UNIVERSITÉ PARIS DESCARTES   (France)

Author keywords

Atomic contact; Electrochemistry; Molecular adsorption; Scanning electrochemical microscope (SECM)

Indexed keywords

ATOMIC CONTACTS; CONDUCTANCE QUANTUM; COPPER NANOWIRES; COPPER SUBSTRATES; CRITICAL MICELLAR CONCENTRATIONS; ELECTROCHEMICAL STIMULUS; I - V CURVE; INITIAL GAP; INTEGER VALUES; MOLECULAR ADSORPTION; MOLECULAR JUNCTION; OHMIC BEHAVIOR; QUANTIZED CONDUCTANCE; REFERENCE ELECTRODES; SCANNING ELECTROCHEMICAL MICROSCOPES; SCANNING ELECTROCHEMICAL MICROSCOPY; SODIUM DODECYL SULFATE; SURFACTANT MOLECULES; TIP RADIUS; WORKING ELECTRODE;

ADSORPTION; ANALYTIC EQUIPMENT; ATOMS; COPPER; ELECTROCHEMISTRY; IODINE; NANOWIRES; PLATINUM; QUANTUM ELECTRONICS; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SODIUM; SODIUM SULFATE; SURFACE ACTIVE AGENTS;

ELECTROCHEMICAL ELECTRODES;

EID: 84865612166     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2012.07.115     Document Type: Article

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