Atom-size gaps and contacts between electrodes fabricated with a self-terminated electrochemical method

Applied Physics Letters

Volumn 80, Issue 13, 2002, Pages 2398-2400

  Boussaad, S ^a   Tao, N J ^a  

^a Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; CONDUCTANCE QUANTUM; CONTACT SIZE; ELECTROCHEMICAL METHODS; ELECTRODEPOSITION PROCESS; EXTERNAL RESISTORS; GAP WIDTHS; METAL ELECTRODES; SELF-TERMINATION; SMALL GAPS;

ELECTRON TUNNELING;

ELECTROCHEMICAL ELECTRODES;

EID: 79956011013     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1465128     Document Type: Article

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