In situ X-ray reflectivity study of polystyrene ultrathin films swollen in carbon dioxide

Macromolecules

Volumn 45, Issue 16, 2012, Pages 6611-6617

  Chebil, M Souheib ^a,b   Vignaud, G ^b   Grohens, Y ^b   Konovalov, O ^c   Sanyal, M K ^d   Beuvier, T ^a   Gibaud, A ^a  

^a UNIVERSITÉ DU MAINE   (France)

^b ENSTA BRETAGNE   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT PRESSURES; CONDENSED STATE; DEPRESSURIZATIONS; IN-SITU; IRREVERSIBLE BEHAVIOR; SUPERCRITICAL STATE; X RAY REFLECTIVITY;

POLYSTYRENES; ULTRATHIN FILMS;

CARBON DIOXIDE;

EID: 84865580925     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma301035f     Document Type: Article

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