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Volumn 96, Issue , 2012, Pages 882-888
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Effect of both deposition temperature and indium doping on the properties of sol-gel dip-coated SnO2 films
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Author keywords
FESEM; In doped SnO2; Sheet resistance; SnO2; Sol gel dip coating; X ray diffraction
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Indexed keywords
BOROFLOAT GLASS;
COMPOSITIONAL ANALYSIS;
CRYSTAL QUALITIES;
CRYSTALLINE STRUCTURE;
DEPOSITION TEMPERATURES;
DIP COATING;
ENERGY DISPERSIVE X-RAY SPECTROMETERS;
FESEM;
FIELD EMISSION SCANNING ELECTRON MICROSCOPES;
IN-DOPED SNO2;
INDIUM CHLORIDE;
INDIUM DOPING;
OPTICAL AND ELECTRICAL PROPERTIES;
OPTIMUM DEPOSITION;
SNO2;
SOL GEL DIP COATING;
VAN DER PAUW METHOD;
CHLORINE COMPOUNDS;
COATINGS;
ELECTRIC PROPERTIES;
INDIUM;
SHEET RESISTANCE;
SOL-GEL PROCESS;
SOL-GELS;
SUBSTRATES;
X RAY DIFFRACTION;
SEMICONDUCTOR DOPING;
INDIUM;
TIN DERIVATIVE;
TIN DIOXIDE;
ARTICLE;
CHEMISTRY;
CRYSTALLIZATION;
LIGHT RELATED PHENOMENA;
PHASE TRANSITION;
PHOTON;
SCANNING ELECTRON MICROSCOPY;
SPECTROMETRY;
TEMPERATURE;
X RAY DIFFRACTION;
CRYSTALLIZATION;
INDIUM;
MICROSCOPY, ELECTRON, SCANNING;
OPTICAL PHENOMENA;
PHASE TRANSITION;
PHOTONS;
SPECTROMETRY, X-RAY EMISSION;
TEMPERATURE;
TIN COMPOUNDS;
X-RAY DIFFRACTION;
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EID: 84865479010
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2012.07.108 Document Type: Article |
Times cited : (18)
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References (28)
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