A new approach for measuring the value of patents based on structural indicators for ego patent citation networks

Journal of the American Society for Information Science and Technology

Volumn 63, Issue 9, 2012, Pages 1834-1842

  Hu, Xiaojun ^a   Rousseau, Ronald ^b,c,d   Chen, Jin ^e  

^a ZHEJIANG UNIVERSITY SCHOOL OF MEDICINE   (China)

^b Katholieke Hogeschool Brugge Oostende   (Belgium)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d UNIVERSITY OF LEUVEN   (Belgium)

^e ZHEJIANG UNIVERSITY   (China)

Author keywords

citation networks; knowledge management; scientometrics

Indexed keywords

CITATION NETWORKS; MULTI-LAYERED APPROACH; PATENT ANALYSIS; PATENT CITATION; SCIENTOMETRICS; TECHNOLOGICAL COMPLEXITY; TECHNOLOGICAL KNOWLEDGE; TECHNOLOGY SECTORS;

KNOWLEDGE MANAGEMENT;

PATENTS AND INVENTIONS;

EID: 84865221357     PISSN: 15322882     EISSN: 15322890     Source Type: Journal    
DOI: 10.1002/asi.22632     Document Type: Article

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