Photoluminescence imaging diagnosis of particulate iron contamination derived from hf dip and thermal oxidation

IEEE Journal of Photovoltaics

Volumn 1, Issue 1, 2011, Pages 66-71

  Baker Finch, Simeon C ^a   McIntosh, Keith R ^b  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b PV Lighthouse   (Australia)

Author keywords

Charge carriers; cleaning; contamination; photoluminescence imaging; silicon

Indexed keywords

CRYSTALLINE SILICONS; CYLINDRICAL COORDINATES; IRON CONTAMINATION; LATERAL FLOW; OUT-DIFFUSION; P-TYPE; PHOTOLUMINESCENCE IMAGING; PL IMAGE; RADIALLY SYMMETRIC; SEMICONDUCTOR EQUATIONS; THERMAL OXIDATION;

CHARGE CARRIERS; CLEANING; CONTAMINATION; IMPURITIES; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; SILICON;

SILICON WAFERS;

EID: 84865161387     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2011.2165699     Document Type: Article

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