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Volumn , Issue , 2010, Pages 439-442
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Iron imaging in multicrystalline silicon wafers via photoluminescence
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
BEFORE AND AFTER;
CELL PROCESSING;
CROSSOVER POINTS;
DISSOLVED IRON;
HIGH RESOLUTION;
HIGH SPATIAL RESOLUTION;
INTERSTITIAL IRON;
MEGA-PIXEL;
MULTICRYSTALLINE SILICON WAFERS;
PAIR BREAKING;
PAIR DISSOCIATION;
PHOSPHORUS GETTERING;
PL MEASUREMENTS;
BORON;
BORON COMPOUNDS;
IMAGING TECHNIQUES;
IRON COMPOUNDS;
PHOSPHORUS;
PHOTOLUMINESCENCE;
PHOTOVOLTAIC EFFECTS;
POLYSILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
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EID: 78650168107
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2010.5616749 Document Type: Conference Paper |
Times cited : (4)
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References (9)
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