Vacancy defects in epitaxial thin film CuGaSe 2 and CuInSe 2

Physical Review B - Condensed Matter and Materials Physics

Volumn 86, Issue 6, 2012, Pages

  Korhonen, E ^a   Kuitunen, K ^a   Tuomisto, F ^a   Urbaniak, A ^b   Igalson, M ^b   Larsen, J ^c   Gutay L ^c   Siebentritt, S ^c   Tomm, Y ^d  

^a AALTO UNIVERSITY   (Finland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c UNIVERSITY OF LUXEMBOURG   (Luxembourg)

^d HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84865100691     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.064102     Document Type: Article

References (18)

1. P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischmann, and M. Powalla, Prog. Photovoltaics PPHOED 1062-7995 10.1002/pip.1078 19, 894 (2011).
2. S. Siebentritt, M. Igalson, C. Persson, and S. Lany, Prog. Photovoltaics PPHOED 1062-7995 10.1002/pip.936 18, 390 (2009).
3. S. Lany and A. Zunger, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2388256 100, 113725 (2006).
4. M. Igalson, in Metastable Defect Distributions in CIGS Solar Cells and Their Impact on Device Efficiency, MRS Symposia Proceedings No. 1012 (Cambridge University Press, Cambridge, UK, 2007), p. 211.
5. S. Lany and A. Zunger, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.72. 035215 72, 035215 (2005).
6. S. Niki, R. Suzuki, S. Ishibashi, T. Ohdaira, P. J. Fons, A. Yamada, H. Oyanagi, T. Wada, R. Kimura, and T. Nakada, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(00)01718-1 387, 129 (2001).
7. M. M. Islam, A. Uedono, S. Ishibashi, K. Tenjinbayashi, T. Sakurai, A. Yamada, S. Ishizuka, K. Matsubara, S. Niki, and K. Akimto, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.3567006 98, 112105 (2011).
8. L. Gütay, J. Larsen, J. Guillot, M. Müller, F. Bertram, J. Christen, and S. Siebentritt, J. Cryst. Growth JCRGAE 0022-0248 10.1016/j.jcrysgro.2010.09.035 315, 82 (2011).
9. S. Siebentritt, I. Beckers, T. Riemann, J. Christen, A. Hoffmann, and M. Dworzak, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1872215 86, 091909 (2009).
10. S. Siebentritt, N. Rega, A. Zajogin, and M. C. Lux-Steiner, Phys. Status Solidi C PSSCGL 1610-1634 10.1002/pssc.200404845 1, 2304 (2004).
11. K. Saarinen, P. Hautojärvi, and C. Corbel, in Identification of Defects in Semiconductors, edited by, M. Stavola, (Academic, San Diego, 1998), pp. 209-85.
12. A. Bauknecht, S. Siebentritt, J. Albert, and M. C. Lux-Steiner, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1357786 89, 4391 (2001).
13. K. Saarinen, T. Laine, K. Skog, J. Mäkinen, P. Hautojärvi, K. Rakennus, P. Uusimaa, A. Salokatve, and M. Pessa, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.77.3407 77, 3407 (1996).
14. K. Saarinen, S. Kuisma, P. Hautojärvi, C. Corbel, and C. LeBerre, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.49.8005 49, 8005 (1994).
15. T. F. Ciszek, J. Cryst. Growth JCRGAE 0022-0248 10.1016/0022-0248(86) 90538-5 79, 689 (1986).
16. J. Gebauer, R. Krause-Rehberg, M. Prokesch, and K. Irmscher, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.66.115206 66, 115206 (2002).
17. M. Hakala, M. J. Puska, and R. M. Nieminen, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.57.7621 57, 7621 (1998).
18. K. Gartsman, L. Chernyak, V. Lyahovitskaya, D. Cahen, V. Didik, V. Kozlovsky, R. Malkovich, E. Skoryatina, and V. Usacheva, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.366252 82, 4282 (1997).