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Volumn 13, Issue 11, 2012, Pages 2346-2351

Determination of the interface energy level alignment of a doped organic hetero-junction using capacitance-voltage measurements

(7) Lee, Sunghun a,d Lee, Jeong Hwan a Kim, Kwon Hyeon a Yoo, Seung Jun a Kim, Tae Gun b Kim, Jeong Won c Kim, Jang Joo a

a Seoul National University (South Korea)

b University of Science and Technology (UST) (South Korea)

c Korea Research Institute of Standards and Science (South Korea)

d Samsung Mobile Display Co (South Korea)

Author keywords

C V measurement; Energy level alignment; Organic p n junction; Organic organic junction

Indexed keywords

ALIGNMENT; CESIUM COMPOUNDS; HETEROJUNCTIONS; PHOTOELECTRON SPECTROSCOPY; ULTRAHIGH VACUUM;

C-V MEASUREMENT; CAPACITANCE VOLTAGE MEASUREMENTS; DEPLETION-LAYER THICKNESS; ENERGY LEVEL ALIGNMENT; ORGANIC P-N JUNCTIONS; ORGANIC/ORGANIC JUNCTIONS; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY; X RAY PHOTOEMISSION SPECTROSCOPY;

CAPACITANCE;

EID: 84865056244 PISSN: 15661199 EISSN: None Source Type: Journal
DOI: 10.1016/j.orgel.2012.06.039 Document Type: Article

Times cited : (34)

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