Plan-view of few layer graphene on 6h-sic by transmission electron microscopy

e-Journal of Surface Science and Nanotechnology

Volumn 10, Issue , 2012, Pages 396-399

  Kuroki, Jun ^a   Norimatsu, Wataru ^a,b   Kusunoki, Michiko ^a,b  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

Electron microscopy; Graphite; Silicon carbide

Indexed keywords

ELECTRON MICROSCOPY; FAST FOURIER TRANSFORMS; GRAPHITE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

FAST FOURIER TRANSFORMATION (FFT); FEW-LAYER GRAPHENE; GRAPHENE LAYERS; IN-PLANE STRUCTURES; MULTIPLE SET; SI FACES; STACKING STRUCTURES; TEM IMAGES;

GRAPHENE;

EID: 84864774004     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2012.396     Document Type: Conference Paper

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