Characterization of atomic step structures on CaF 2(111) by their electric potential

Applied Physics Letters

Volumn 101, Issue 5, 2012, Pages

  Pieper, H H ^a   Barth, C ^b   Reichling, M ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STEP; IMAGING CONTRAST; KELVIN PROBE FORCE MICROSCOPY; NONCONTACT ATOMIC FORCE MICROSCOPY; POSITIVE POTENTIAL; STEP EDGE; SUB-LATTICES; TYPE II;

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL;

CRYSTAL ATOMIC STRUCTURE;

EID: 84864674806     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4739944     Document Type: Article

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