Facile morphological control of single-crystalline silicon nanowires

Applied Surface Science

Volumn 258, Issue 24, 2012, Pages 9792-9799

  Wu, Shao Long ^a   Zhang, Ting ^a   Zheng, Rui Ting ^a   Cheng, Guo An ^a  

^a Beijing Normal University   (China)

Author keywords

Morphological control; Porosity; Rough surface; Slanting aligned nanowires; Vertically aligned nanowires; Zigzag silicon nanowires

Indexed keywords

ASPECT RATIO; CRYSTALLINE MATERIALS; DOPING (ADDITIVES); ETCHING; METAL NANOPARTICLES; NANOWIRES; POROSITY; SILICON WAFERS; SILVER NANOPARTICLES; SUBSTRATES;

METAL-ASSISTED CHEMICAL ETCHING; MORPHOLOGICAL CONTROL; OXIDANT CONCENTRATIONS; ROUGH SURFACES; SILICON NANOWIRES; SINGLE CRYSTALLINE SILICON; SUBSTRATE PROPERTIES; VERTICALLY ALIGNED NANOWIRES;

CRYSTAL ORIENTATION;

EID: 84864654020     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.06.031     Document Type: Article

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