Probing electron-induced bond cleavage at the single-molecule level using DNA origami templates

ACS Nano

Volumn 6, Issue 5, 2012, Pages 4392-4399

  Keller, Adrian ^a,b   Bald, Ilko ^a,e   Rotaru, Alexandru ^a,c   Cauët, Emilie ^d   Gothelf, Kurt V ^a   Besenbacher, Flemming ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^c PETRU PONI INSTITUTE OF MACROMOLECULAR CHEMISTRY   (Romania)

^d UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^e UNIVERSITY OF POTSDAM   (Germany)

Author keywords

Ab initio calculations; Atomic force microscopy; DNA origami; DNA radiation damage; Low energy electrons

Indexed keywords

AB INITIO CALCULATIONS; BOND CLEAVAGES; BOND DISSOCIATION; DINUCLEOTIDES; DISULFIDE BONDS; DNA ORIGAMIS; DNA STRAND BREAK; ELECTRON-INDUCED DISSOCIATION; HALOGENATED BENZENES; LOW ENERGY ELECTRONS; NATURAL ENVIRONMENTS; NOVEL TECHNIQUES; NUCLEOBASES; NUCLEOSOMES; SECONDARY STRUCTURES; SELF-ASSEMBLED DNA; SINGLE MOLECULE LEVEL; SMALL ORGANIC MOLECULES;

ATMOSPHERIC CHEMISTRY; ATOMIC FORCE MICROSCOPY; BENZENE; COMPLEXATION; COVALENT BONDS; DISSOCIATION; ELECTRONS; MOLECULES; OLIGONUCLEOTIDES; RADIATION DAMAGE;

DNA;

DNA;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRON;

DNA; ELECTRONS; MICROSCOPY, ATOMIC FORCE;

EID: 84864647669     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn3010747     Document Type: Article

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