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Volumn 108, Issue 1, 2012, Pages 177-183

Reversible resistance switching properties in Ti-doped polycrystalline Ta 2O 5 thin films

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; CONDUCTIVE FILAMENTS; CONSTANT STRESS; DEVICE STRUCTURES; HIGH-RESISTANCE STATE; LOW RESISTANCE; LOW-RESISTANCE STATE; POLYCRYSTALLINE TA; RESISTANCE SWITCHING; RESISTANCE SWITCHING EFFECT; RETENTION PROPERTIES; TI ADDITION;

EID: 84864551165     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-012-6868-8     Document Type: Article
Times cited : (6)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.