Excitation power and temperature dependence of excitons in CuInSe 2

Journal of Applied Physics

Volumn 111, Issue 9, 2012, Pages

  Luckert, F ^a   Yakushev, M V ^a   Faugeras, C ^b   Karotki, A V ^c   Mudryi, A V ^c   Martin, R W ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b Grenoble HMFL   (France)

^c INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX DEFECTS; CONDUCTION BAND ELECTRONS; EXCITATION POWER; FREE EXCITONS; HIGH QUALITY; PL SPECTRA; RADIATIVE RECOMBINATION; RECOMBINATION PROCESS; REFLECTANCE SPECTROSCOPY; TEMPERATURE DEPENDENCE; TEMPERATURE QUENCHING; VALENCE-BAND HOLES;

ACTIVATION ENERGY; COPPER COMPOUNDS; DEFECTS;

EXCITONS;

EID: 84864194058     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4709448     Document Type: Article

References (38)

1. I. Repins, M. A. Contreras, B. Egaas, C. DeHart, J. Scharf, C. L. Perkins, B. To, and R. Noufi, Prog. Photovoltaics 16, 235 (2008). 10.1002/pip.822
2. W. Shockley and H. J. Queisser, J. Appl. Phys. 32, 510 (1961). 10.1063/1.1736034
3. J. E. Jaffe and A. Zunger, Phys. Rev. B 29, 1882 (1984). 10.1103/PhysRevB.29.1882
4. J. E. Rowe and J. L. Shay, Phys. Rev. B 3, 451 (1971). 10.1103/PhysRevB.3.451
5. J. L. Shay, B. Tell, H. M. Kasper, and L. M. Schiavone, Phys. Rev. B 7, 4485 (1973). 10.1103/PhysRevB.7.4485
6. S. Chatraphorn, K. Yoodee, P. Songpongs, and C. Chityuttakan, Jpn. J. Appl. Phys., Part 1 39 (Suppl. 39-1), 102 (2000).
7. S. Chatraphorn, K. Yoodee, P. Songpongs, C. Chityuttakan, K. Sayavong, S. Wongmanerod, and P. O. Holtz, Jpn. J. Appl. Phys., Part 2 37, L269 (1998). 10.1143/JJAP.37.L269
8. M. V. Yakushev, F. Luckert, C. Faugeras, A. V. Karotki, A. V. Mudryi, and R. W. Martin, Appl. Phys. Lett. 97, 152110 (2010). 10.1063/1.3502603
9. S. B. Zhang, S.-H. Wei, A. Zunger, and H. Katayama-Yoshida, Phys. Rev. B 57, 9642 (1998). 10.1103/PhysRevB.57.9642
10. C. Rincón and R. Márquez, J. Phys. Chem. Solids 60, 1865 (1999). 10.1016/S0022-3697(99)00190-0
11. P. Yu, J. Appl. Phys. 47, 677 (1976). 10.1063/1.322633
12. F. Abou-Elfotouh, H. Moutinho, A. Bakry, T. J. Coutts, and L. L. Kazmerski, Sol. Cells 30, 151 (1991). 10.1016/0379-6787(91)90048-T
13. C. Rincón, J. González, and G. Sánchez Pérez, J. Appl. Phys. 54, 6634 (1983). 10.1063/1.331900
14. P. Migliorato, J. L. Shay, H. M. Kasper, and W. Sigurd, J. Appl. Phys. 46, 1777 (1975). 10.1063/1.321782
15. J. Krustok, H. Collan, M. Yakushev, and K. Hjelt, Phys. Scr. T79, 179 (1999). 10.1238/Physica.Topical.079a00179
16. D. G. Thomas and J. J. Hopfield, Phys. Rev. 116, 573 (1959). 10.1103/PhysRev.116.573
17. F. Luckert, M. V. Yakushev, C. Faugeras, A. V. Karotki, A. V. Mudryi, and R. W. Martin, Appl. Phys. Lett. 97, 162101 (2010). 10.1063/1.3502608
18. J. J. M. Binsma, L. J. Giling, and J. Bloem, J. Lumin. 27, 55 (1982). 10.1016/0022-2313(82)90029-1
19. J. H. Schön and E. Bucher, Appl. Phys. Lett. 73, 211 (1998). 10.1063/1.121758
20. C. Rincon, S. M. Wasim, E. Hernandez, M. A. Arsene, F. Voillot, J. P. Peyrade, G. Bacquet, and A. Albacete, J. Phys. Chem. Solids 59, 245 (1998). 10.1016/S0022-3697(97)00136-4
21. A. V. Mudriy, I. V. Bodnar, I. A. Viktorov, V. F. Gremenok, M. V. Yakushev, R. D. Tomlinson, A. E. Hill, and R. D. Pilkington, Appl. Phys. Lett. 77, 2542 (2000). 10.1063/1.1308525
22. A. Bauknecht, S. Siebentritt, J. Albert, Y. Tomm, and M. C. Lux-Steiner, Jpn. J. Appl. Phys., Part 1 39, 322 (2000).
23. J. Weber, W. Schmid, and R. Sauer, Phys. Rev. B 21, 2401 (1980). 10.1103/PhysRevB.21.2401
24. M. V. Yakushev, R. W. Martin, and A. V. Mudryi, Phys. Status Solidi C 6, 1082 (2009). 10.1002/pssc.200881155
25. R. D. Tomlinson, Sol. Cells 16, 17 (1986). 10.1016/0379-6787(86)90072-4
26. M. V. Yakushev, Y. Feofanov, R. W. Martin, R. D. Tomlinson, and A. Mudryi, J. Phys. Chem. Solids 64, 2011 (2003). 10.1016/S0022-3697(03)00090-8
27. Y. Toyozawa, Prog. Theor. Phys. 20, 53 (1958). 10.1143/PTP.20.53
28. E. W. Williams and H. B. Bebb, Transport and Optical Phenomena (Academic, New York, 1972).
29. M. V. Yakushev, A. V. Mudryi, I. V. Victorov, J. Krustok, and E. Mellikov, Appl. Phys. Lett. 88, 011922 (2006). 10.1063/1.2152114
30. K. Wakita, Y. Ohta, and N. Ohgushi, Thin Solid Films 509, 154 (2006). 10.1016/j.tsf.2005.09.137
31. H. Tanino, T. Maeda, H. Fujikake, H. Nakanishi, S. Endo, and T. Irie, Phys. Rev. B 45, 13323 (1992). 10.1103/PhysRevB.45.13323
32. T. Schmidt, K. Lischka, and W. Zulehner, Phys. Rev. B 45, 8989 (1992). 10.1103/PhysRevB.45.8989
33. A. Yamada, Y. Makita, S. Niki, A. Obara, P. Fons, H. Shibata, M. Kawai, S. Chichibu, and H. Nakanishi, J. Appl. Phys. 79, 4318 (1996). 10.1063/1.361800
34. J. J. Hopfield, D. G. Thomas, and R. T. Lynch, Phys. Rev. Lett. 17, 312 (1966). 10.1103/PhysRevLett.17.312
35. J. Krustok, J. Raudoja, and R. Jaaniso, Appl. Phys. Lett. 89, 051905 (2006). 10.1063/1.2266597
36. M. Leroux, N. Grandjean, B. Beaumont, G. Nataf, F. Semond, J. Massies, and P. Gibart, J. Appl. Phys. 86, 3721 (1999). 10.1063/1.371242
37. D. Bimberg, M. Sondergeld, and E. Grobe, Phys. Rev. B 4, 3451 (1971). 10.1103/PhysRevB.4.3451
38. H. Zimmermann, R. Boyn, and K. Piel, J. Phys. Condens. Matter 4, 859 (1992). 10.1088/0953-8984/4/3/025