Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS2

Applied Physics Letters

Volumn 89, Issue 5, 2006, Pages

  Krustok, J ^a   Raudoja, J ^a   Jaaniso, R ^b  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

^b UNIVERSITY OF TARTU   (Estonia)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; CRYSTAL DEFECTS; ELECTRIC EXCITATION; GROUND STATE; PHONONS; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; THERMAL EFFECTS;

ELECTRON-PHONON COUPLING; ISOELECTRONIC DEFECT; PHONON ENERGY; ZERO-PHONON LINES (ZPL);

EXCITONS;

EID: 33748459467     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2266597     Document Type: Article

References (28)

1. S. B. Zhang, S.-H. Wei, A. Zunger, and H. Katayama-Yoshida, Phys. Rev. B 57, 9642 (1998).
2. K. Wakita, H. Hirooka, S. Yasuda, F. Fujita, and N. Yamamoto, J. Appl. Phys. 83, 443 (1998).
3. J. J. M. Binsma, L. J. Gilliny, and J. Bloem, J. Lumin. 27, 55 (1982).
4. K. Yoshino, T. Ikari, and S. Shirakata, Appl. Phys. Lett. 78, 742 (2001).
5. S. Shirakata and H. Miyake, J. Phys. Chem. Solids 64, 2021 (2003).
6. M. V. Yakushev, A. V. Mudryi, I. V. Victorov, J. Krustok, and E. Mellikov, Appl. Phys. Lett. 88, 011922 (2006).
7. J. Krustok, J. H. Schön, H. Collan, M. Yakushev, J. Mädasson, and E. Bucher, J. Appl. Phys. 86, 364 (1999).
8. J. Krustok, J. Raudoja, J.-H. Schön, M. Yakushev, and H. Collan, Thin Solid Films 361-362, 406 (2000).
9. J. Krustok, J. Raudoja, M. Krunks, H. Mändar, and H. Collan, J. Appl. Phys. 88, 205 (2000).
10. J. Weber, H. Bauch, and R. Sauer, Phys. Rev. B 25, 7688 (1982).
11. T. N. Morgan, B. Weiber, and R. N. Bhargava, Phys. Rev. 166, 751 (1968).
12. C. H. Henry, P. J. Dean, and J. D. Cuthbert, Phys. Rev. 166, 754 (1968).
13. C. I. Rablau and N. C. Giles, J. Appl. Phys. 90, 3314 (2001).
14. G. Davies, T. Gregorkiewicz, M. Z. Iqbal, M. Kleverman, E. C. Lightowlers, N. Q. Vinh, and M. Zhu, Phys. Rev. B 67, 235111 (2003).
15. J. J. Hopfield, D. G. Thomas, and R. T. Lynch, Phys. Rev. Lett. 17, 312 (1966).
16. J. Shah and E. Buehler, Phys. Rev. B 4, 2827 (1971).
17. R. E. Nahory, Jagdeep Shah, R. C. C. Leite, E. Buehler, and J. H. Wernick, Phys. Rev. B 1, 4677 (1970).
18. J. Krustok, J. Raudoja, and H. Collan, Thin Solid Films 387, 195 (2001).
19. K. K. Rebane, Impurity Spectra of Solids (Plenum, New York, 1970).
20. A. Freiberg and L. A. Rebane, Phys. Status Solidi B 81, 359 (1977).
21. C. Hecht, R. Kummer, M. Thoms, and A. Winnacker, Phys. Rev. B 55, 13625 (1997).
22. M. A. Krivoglas, Sov. Phys. Solid State 6, 1340 (1964).
23. I. S. Osadko, Fiz. Tverd. Tela (Leningrad) 19, 1683 (1977).
24. D. Hsu and J. L. Skinner, J. Chem. Phys. 83, 2097 (1985).
25. I. S. Osadko, Sov. Phys. Usp. 22, 311 (1979).
26. D. Hsu and J. L. Skinner, J. Chem. Phys. 81, 5471 (1984).
27. V. Hizhnyakov, H. Kaasik, and I. Sildos, Phys. Status Solidi B 234, 644 (2002).
28. V. Hizhnyakov, V. Boltrushko, H. Kaasik, and I. Sildos, J. Chem. Phys. 119, 6290 (2003).