SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 23, Issue 7, 2012, Pages 1338-1341

Properties of pulse plated SnSe films

(5) Ananthi, K a Thilakavathy, K a Muthukumarasamy, N a Dhanapandian, S b Murali, K R c

a Department of Artificial Intelligence and Machine Learning (India)

b ANNAMALAI UNIVERSITY (India)

c CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE (India)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE MEASUREMENTS; DUTY CYCLES; INTERFERENCE FRINGE; P-TYPE; PULSE ELECTRODEPOSITION; ROOM-TEMPERATURE RESISTIVITY; TIN CHLORIDES; TRANSMISSION SPECTRUMS; XRD;

ATOMIC FORCE MICROSCOPY; CHLORINE COMPOUNDS; OPEN CIRCUIT VOLTAGE; SURFACE ROUGHNESS; TIN;

REFRACTIVE INDEX;

EID: 84863988360 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-011-0595-3 Document Type: Article

Times cited : (12)

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