Influence of the substrate temperature on the structural, optical, and electrical properties of tin selenide thin films deposited by thermal evaporation method

Crystal Research and Technology

Volumn 45, Issue 1, 2010, Pages 53-58

  Kumar, N ^a   Sharma, V ^a   Padha, N ^a   Shah, N M ^b   Desai, M S ^b   Panchal, C J ^b   Protsenko, I Yu ^c  

^a UNIVERSITY OF JAMMU   (India)

^b M S UNIVERSITY OF BARODA   (India)

^c SUMY STATE UNIVERSITY   (Ukraine)

Author keywords

SEM; Substrate temperature; Tin selenide thin film; Transmission analysis; XRD

Indexed keywords

SEM; SUBSTRATE TEMPERATURE; THIN-FILM TRANSMISSION; TIN SELENIDES; XRD;

ACTIVATION ANALYSIS; ACTIVATION ENERGY; DATA HANDLING; DIFFRACTION; ELECTRIC PROPERTIES; IMAGE ANALYSIS; LIGHT TRANSMISSION; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; THERMAL EVAPORATION; THIN FILM DEVICES; THIN FILMS; TIN; TITANIUM COMPOUNDS; VAPORS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SUBSTRATES;

EID: 73849146530     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200900424     Document Type: Article

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